Channel Coding for Nonvolatile Memory Technologies: Theoretical Advances and Practical Considerations
Every bit of information in a storage or memory device is bound by a multitude of performance specifications, and is subject to a variety of reliability impediments. At the other end, the physical processes tamed to remember our bits offer a constant source of risk to their reliability. These includ...
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| Vydané v: | Proceedings of the IEEE Ročník 105; číslo 9; s. 1705 - 1724 |
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| Hlavní autori: | , |
| Médium: | Journal Article |
| Jazyk: | English |
| Vydavateľské údaje: |
New York
IEEE
01.09.2017
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Predmet: | |
| ISSN: | 0018-9219, 1558-2256 |
| On-line prístup: | Získať plný text |
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