Channel Coding for Nonvolatile Memory Technologies: Theoretical Advances and Practical Considerations

Every bit of information in a storage or memory device is bound by a multitude of performance specifications, and is subject to a variety of reliability impediments. At the other end, the physical processes tamed to remember our bits offer a constant source of risk to their reliability. These includ...

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Bibliographic Details
Published in:	Proceedings of the IEEE Vol. 105; no. 9; pp. 1705 - 1724
Main Authors:	Dolecek, Lara, Cassuto, Yuval
Format:	Journal Article
Language:	English
Published:	New York IEEE 01.09.2017 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:	Algebraic codes BCH codes Channel coding Coding Computer architecture Data storage Drives error-correction code (ECC) Flash memories graph codes LDPC codes Mathematical analysis Matrix methods Memory devices Microprocessors Nonvolatile memory Phase transitions Reliability rewrite codes Solid-state circuits WOM codes
ISSN:	0018-9219, 1558-2256
Online Access:	Get full text
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