APA (7th ed.) Citation

Liu, K., Wu, J., Sun, Q., Yang, H., & Wan, R. (2024). Harnessing Test-Oriented Knowledge Graphs for Enhanced Test Function Recommendation. Electronics (Basel), 13(8), 1547. https://doi.org/10.3390/electronics13081547

Chicago Style (17th ed.) Citation

Liu, Kaiqi, Ji Wu, Qing Sun, Haiyan Yang, and Ruiyuan Wan. "Harnessing Test-Oriented Knowledge Graphs for Enhanced Test Function Recommendation." Electronics (Basel) 13, no. 8 (2024): 1547. https://doi.org/10.3390/electronics13081547.

MLA (9th ed.) Citation

Liu, Kaiqi, et al. "Harnessing Test-Oriented Knowledge Graphs for Enhanced Test Function Recommendation." Electronics (Basel), vol. 13, no. 8, 2024, p. 1547, https://doi.org/10.3390/electronics13081547.