Unsupervised Multiview Fuzzy C-Means Clustering Algorithm
The rapid development in information technology makes it easier to collect vast numbers of data through the cloud, internet and other sources of information. Multiview clustering is a significant way for clustering multiview data that may come from multiple ways. The fuzzy c-means (FCM) algorithm fo...
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| Published in: | Electronics (Basel) Vol. 12; no. 21; p. 4467 |
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| Main Authors: | , , |
| Format: | Journal Article |
| Language: | English |
| Published: |
Basel
MDPI AG
01.11.2023
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| Subjects: | |
| ISSN: | 2079-9292, 2079-9292 |
| Online Access: | Get full text |
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| Summary: | The rapid development in information technology makes it easier to collect vast numbers of data through the cloud, internet and other sources of information. Multiview clustering is a significant way for clustering multiview data that may come from multiple ways. The fuzzy c-means (FCM) algorithm for clustering (single-view) datasets was extended to process multiview datasets in the literature, called the multiview FCM (MV-FCM). However, most of the MV-FCM clustering algorithms and their extensions in the literature need prior information about the number of clusters and are also highly influenced by initializations. In this paper, we propose a novel MV-FCM clustering algorithm with an unsupervised learning framework, called the unsupervised MV-FCM (U-MV-FCM), such that it can search an optimal number of clusters during the iteration process of the algorithm without giving the number of clusters a priori. It is also free of initializations and parameter selection. We then use three synthetic and six benchmark datasets to make comparisons between the proposed U-MV-FCM and other existing algorithms and to highlight its practical implications. The experimental results show that our proposed U-MV-FCM algorithm is superior and more useful for clustering multiview datasets. |
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| Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
| ISSN: | 2079-9292 2079-9292 |
| DOI: | 10.3390/electronics12214467 |