Software defect prediction using stacked denoising autoencoders and two-stage ensemble learning

Software defect prediction (SDP) plays an important role in allocating testing resources reasonably, reducing testing costs, and ensuring software quality. However, software metrics used for SDP are almost entirely traditional features compared with deep representations (DPs) from deep learning. Alt...

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Bibliographic Details

Published in:	Information and software technology Vol. 96; pp. 94 - 111
Main Authors:	Tong, Haonan, Liu, Bin, Wang, Shihai
Format:	Journal Article
Language:	English
Published:	Elsevier B.V 01.04.2018
Subjects:	Deep learning Ensemble learning Software defect prediction Software metrics Stacked denoising autoencoders Deep learning Software metrics Ensemble learning Software defect prediction Stacked denoising autoencoders
ISSN:	0950-5849, 1873-6025
Online Access:	Get full text
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