Software defect prediction using stacked denoising autoencoders and two-stage ensemble learning

Software defect prediction (SDP) plays an important role in allocating testing resources reasonably, reducing testing costs, and ensuring software quality. However, software metrics used for SDP are almost entirely traditional features compared with deep representations (DPs) from deep learning. Alt...

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Vydané v:	Information and software technology Ročník 96; s. 94 - 111
Hlavní autori:	Tong, Haonan, Liu, Bin, Wang, Shihai
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	Elsevier B.V 01.04.2018
Predmet:	Deep learning Ensemble learning Software defect prediction Software metrics Stacked denoising autoencoders Deep learning Software metrics Ensemble learning Software defect prediction Stacked denoising autoencoders
ISSN:	0950-5849, 1873-6025
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