Kim, Y., Choi, J., Yoo, S., & Park, M. (2024). Propagation and Masking Characteristics of Errors During Software Testing in Synchronous Programming. IEEE access, 12, 146009-146021. https://doi.org/10.1109/ACCESS.2024.3469729
Citácia podle Chicago (17th ed.)Kim, Young-Mi, Jin-Young Choi, Seunghoon Yoo, a Myunghwan Park. "Propagation and Masking Characteristics of Errors During Software Testing in Synchronous Programming." IEEE Access 12 (2024): 146009-146021. https://doi.org/10.1109/ACCESS.2024.3469729.
Citácia podľa MLA (8th ed.)Kim, Young-Mi, et al. "Propagation and Masking Characteristics of Errors During Software Testing in Synchronous Programming." IEEE Access, vol. 12, 2024, pp. 146009-146021, https://doi.org/10.1109/ACCESS.2024.3469729.
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