TPAD: Hardware Trojan Prevention and Detection for Trusted Integrated Circuits
There are increasing concerns about possible malicious modifications of integrated circuits (ICs) used in critical applications. Such attacks are often referred to as hardware Trojans. While many techniques focus on hardware Trojan detection during IC testing, it is still possible for attacks to go...
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| Vydané v: | IEEE transactions on computer-aided design of integrated circuits and systems Ročník 35; číslo 4; s. 521 - 534 |
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| Hlavní autori: | , , , , , |
| Médium: | Journal Article |
| Jazyk: | English |
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New York
IEEE
01.04.2016
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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| ISSN: | 0278-0070, 1937-4151 |
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| Abstract | There are increasing concerns about possible malicious modifications of integrated circuits (ICs) used in critical applications. Such attacks are often referred to as hardware Trojans. While many techniques focus on hardware Trojan detection during IC testing, it is still possible for attacks to go undetected. Using a combination of new design techniques and new memory technologies, we present a new approach that detects a wide variety of hardware Trojans during IC testing and also during system operation in the field. Our approach can also prevent a wide variety of attacks during synthesis, place-and-route, and fabrication of ICs. It can be applied to any digital system, and can be tuned for both traditional and split-manufacturing methods. We demonstrate its applicability for both application-specified integrated circuits and field-programmable gate arrays. Using fabricated test chips with Trojan emulation capabilities and also using simulations, we demonstrate: 1) the area and power costs of our approach can range between 7.4%-165% and 7%-60%, respectively, depending on the design and the attacks targeted; 2) the speed impact can be minimal (close to 0%); 3) our approach can detect 99.998% of Trojans (emulated using test chips) that do not require detailed knowledge of the design being attacked; 4) our approach can prevent 99.98% of specific attacks (simulated) that utilize detailed knowledge of the design being attacked (e.g., through reverse engineering); and 5) our approach never produces any false positives, i.e., it does not report attacks when the IC operates correctly. |
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| AbstractList | There are increasing concerns about possible malicious modifications of integrated circuits (ICs) used in critical applications. Such attacks are often referred to as hardware Trojans. While many techniques focus on hardware Trojan detection during IC testing, it is still possible for attacks to go undetected. Using a combination of new design techniques and new memory technologies, we present a new approach that detects a wide variety of hardware Trojans during IC testing and also during system operation in the field. Our approach can also prevent a wide variety of attacks during synthesis, place-and-route, and fabrication of ICs. It can be applied to any digital system, and can be tuned for both traditional and split-manufacturing methods. We demonstrate its applicability for both application-specified integrated circuits and field-programmable gate arrays. Using fabricated test chips with Trojan emulation capabilities and also using simulations, we demonstrate: 1) the area and power costs of our approach can range between 7.4%-165% and 7%-60%, respectively, depending on the design and the attacks targeted; 2) the speed impact can be minimal (close to 0%); 3) our approach can detect 99.998% of Trojans (emulated using test chips) that do not require detailed knowledge of the design being attacked; 4) our approach can prevent 99.98% of specific attacks (simulated) that utilize detailed knowledge of the design being attacked (e.g., through reverse engineering); and 5) our approach never produces any false positives, i.e., it does not report attacks when the IC operates correctly. |
| Author | Wong, Simon Hu, Yunqing Alexander Wu, Tony F. Mitra, Subhasish Wong, H.-S. Philip Ganesan, Karthik |
| Author_xml | – sequence: 1 givenname: Tony F. surname: Wu fullname: Wu, Tony F. email: tonyfwu@stanford.edu organization: Department of Electrical Engineering, Stanford University, Stanford, CA, USA – sequence: 2 givenname: Karthik surname: Ganesan fullname: Ganesan, Karthik organization: Department of Electrical Engineering, Stanford University, Stanford, CA, USA – sequence: 3 givenname: Yunqing Alexander surname: Hu fullname: Hu, Yunqing Alexander organization: Department of Electrical Engineering, Stanford University, Stanford, CA, USA – sequence: 4 givenname: H.-S. Philip surname: Wong fullname: Wong, H.-S. Philip organization: Department of Electrical Engineering, Stanford University, Stanford, CA, USA – sequence: 5 givenname: Simon surname: Wong fullname: Wong, Simon organization: Department of Electrical Engineering, Stanford University, Stanford, CA, USA – sequence: 6 givenname: Subhasish surname: Mitra fullname: Mitra, Subhasish organization: Department of Electrical Engineering, Stanford University, Stanford, CA, USA |
| BookMark | eNp9kE9Lw0AQxRepYFv9AOIl4Dl1Z_9ks95Kq7ZQtId4XjbZiaTUpG42it_exIoHD55mBt5vHu9NyKhuaiTkEugMgOqbbDFfzhgFOWNCCa74CRmD5ioWIGFExpSpNKZU0TMyadsdpSAk02PymG3ny9toZb37sB6jzDc7W0dbj-9Yh6qpI1u7aIkBi--rbHyv6dqALlrXAV-8HdZF5YuuCu05OS3tvsWLnzklz_d32WIVb54e1ov5Ji641CHWArjlZSKBYSHykkpBHUgJTmNuE6dpnkrhGOZARZm4PFdUcKfLsg-HWvApuT7-PfjmrcM2mF3T-bq3NKDSRGsJkvcqOKoK37Stx9IcfPVq_acBaobazFCbGWozP7X1jPrDFFWwQ_bgbbX_l7w6khUi_jopxjRLOf8CDNB7Yg |
| CODEN | ITCSDI |
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| ContentType | Journal Article |
| Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016 |
| Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016 |
| DBID | 97E RIA RIE AAYXX CITATION 7SC 7SP 8FD JQ2 L7M L~C L~D |
| DOI | 10.1109/TCAD.2015.2474373 |
| DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE/IET Electronic Library (IEL) (UW System Shared) CrossRef Computer and Information Systems Abstracts Electronics & Communications Abstracts Technology Research Database ProQuest Computer Science Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional |
| DatabaseTitle | CrossRef Technology Research Database Computer and Information Systems Abstracts – Academic Electronics & Communications Abstracts ProQuest Computer Science Collection Computer and Information Systems Abstracts Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Professional |
| DatabaseTitleList | Technology Research Database |
| Database_xml | – sequence: 1 dbid: RIE name: IEEE/IET Electronic Library (IEL) (UW System Shared) url: https://ieeexplore.ieee.org/ sourceTypes: Publisher |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering |
| EISSN | 1937-4151 |
| EndPage | 534 |
| ExternalDocumentID | 4045933181 10_1109_TCAD_2015_2474373 7229283 |
| Genre | orig-research |
| GrantInformation_xml | – fundername: IARPA Trusted Integrated Chips Program |
| GroupedDBID | --Z -~X 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AARMG AASAJ AAWTH ABAZT ABQJQ ABVLG ACGFS ACIWK ACNCT AENEX AETIX AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD HZ~ H~9 IBMZZ ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P PZZ RIA RIE RNS TN5 VH1 VJK AAYXX CITATION 7SC 7SP 8FD JQ2 L7M L~C L~D |
| ID | FETCH-LOGICAL-c359t-9413a3f6512ec4bf0540d1551d9eba6d90b854d2eb104f6dbb7043d9ff474e943 |
| IEDL.DBID | RIE |
| ISICitedReferencesCount | 70 |
| ISICitedReferencesURI | http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000372995000001&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| ISSN | 0278-0070 |
| IngestDate | Sun Nov 30 05:00:31 EST 2025 Sat Nov 29 01:40:39 EST 2025 Tue Nov 18 22:20:18 EST 2025 Wed Aug 27 02:29:00 EDT 2025 |
| IsDoiOpenAccess | false |
| IsOpenAccess | true |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 4 |
| Keywords | hardware security concurrent error detection randomized codes resistive RAM (RRAM) hardware Trojan reliable computing split manufacturing 3-D integration |
| Language | English |
| License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c359t-9413a3f6512ec4bf0540d1551d9eba6d90b854d2eb104f6dbb7043d9ff474e943 |
| Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
| PQID | 1786995153 |
| PQPubID | 85470 |
| PageCount | 14 |
| ParticipantIDs | ieee_primary_7229283 crossref_primary_10_1109_TCAD_2015_2474373 proquest_journals_1786995153 crossref_citationtrail_10_1109_TCAD_2015_2474373 |
| PublicationCentury | 2000 |
| PublicationDate | 2016-April 2016-4-00 20160401 |
| PublicationDateYYYYMMDD | 2016-04-01 |
| PublicationDate_xml | – month: 04 year: 2016 text: 2016-April |
| PublicationDecade | 2010 |
| PublicationPlace | New York |
| PublicationPlace_xml | – name: New York |
| PublicationTitle | IEEE transactions on computer-aided design of integrated circuits and systems |
| PublicationTitleAbbrev | TCAD |
| PublicationYear | 2016 |
| Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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| SSID | ssj0014529 |
| Score | 2.47501 |
| Snippet | There are increasing concerns about possible malicious modifications of integrated circuits (ICs) used in critical applications. Such attacks are often... |
| SourceID | proquest crossref ieee |
| SourceType | Aggregation Database Enrichment Source Index Database Publisher |
| StartPage | 521 |
| SubjectTerms | 3D Integration Concurrent Error Detection Electronics industry Encoding Hardware Hardware Security Hardware Trojan Integrated circuits Monitoring Random access memory Randomized Codes Reliable Computing Resistive RAM Split-manufacturing Trojan horses Wires |
| Title | TPAD: Hardware Trojan Prevention and Detection for Trusted Integrated Circuits |
| URI | https://ieeexplore.ieee.org/document/7229283 https://www.proquest.com/docview/1786995153 |
| Volume | 35 |
| WOSCitedRecordID | wos000372995000001&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVIEE databaseName: IEEE/IET Electronic Library (IEL) (UW System Shared) customDbUrl: eissn: 1937-4151 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0014529 issn: 0278-0070 databaseCode: RIE dateStart: 19820101 isFulltext: true titleUrlDefault: https://ieeexplore.ieee.org/ providerName: IEEE |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LS8NAEB7a4kEPvqpYrbIHT2LaPDa7WW_FWvRSeojQW9hkJ1CRVNJU_76726QoiuAtkNmQzOzOTObxDcC1iAST2i9wKPelQzGUToqRZzqWPa71YaYktcMm-HQazedi1oLbbS8MItriMxyYS5vLV8tsbUJlQ-77QpvDNrQ5Z5terW3GwCQQbTzFIMbqfVxnMD1XDGP9UaaIKxz4lBson282yA5V-aGJrXmZHPzvxQ5hv3YjyWgj9yNoYXEMe1_ABbswjWej8R0xqfkPWSKJy-WLLEiD2bQsiCwUGWNli7EKor1XTbM24U_y1IBIKHK_KLP1olqdwPPkIb5_dOrpCU4WhKJyhDZPMsiZtuiY0TQ3vpkyDpISmEqmhJtGIVW-VtYuzZlKU-7SQIk810xCQYNT6BTLAs-A5G4u9B0MMMupZmmKnsEU8AKWegwF64Hb8DPJamhxM-HiNbG_GK5IjAgSI4KkFkEPbrZL3ja4Gn8Rdw3Pt4Q1u3vQb4SW1CdvlXg8YkK7jWFw_vuqC9jVz2ab6ps-dKpyjZewk71Xi1V5ZTfVJymJx-c |
| linkProvider | IEEE |
| linkToHtml | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LS8NAEB58gXrwLdbnHjyJ0Tw2m6y34gOLtfQQwVvYZCdQkVTSVP--O9u0KIrgLZBZkszszkzm8Q3AqYylUMYvcHjkK4djqJwMY486lr3I6MNcK26HTUS9Xvz8LPtzcD7rhUFEW3yGF3Rpc_l6mI8pVHYZ-b405nAeFmlyVtOtNcsZUArRRlQIM9bs5CaH6bnyMjGfRWVc4YXPIwLz-WaF7FiVH7rYGpi79f-92gasNY4ka08kvwlzWG7B6hd4wW3oJf32zRWj5PyHqpAl1fBFlWyK2jQsmSo1u8HalmOVzPivhmZMAVDWmcJIaHY9qPLxoB7twNPdbXJ97zTzE5w8CGXtSMMjFRTC2HTMeVaQd6bJRdISMyW0dLM45No36trlhdBZFrk80LIoDJNQ8mAXFsphiXvACreQ5g4GmBfcsDRDj1AFvEBknkApWuBO-ZnmDbg4zbh4Te1PhitTEkFKIkgbEbTgbLbkbYKs8RfxNvF8RtiwuwWHU6GlzdkbpV4UC2kcxzDY_33VCSzfJ4_dtNvpPRzAinmOmNTiHMJCXY3xCJby93owqo7tBvsEv9HLMA |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=TPAD%3A+Hardware+Trojan+Prevention+and+Detection+for+Trusted+Integrated+Circuits&rft.jtitle=IEEE+transactions+on+computer-aided+design+of+integrated+circuits+and+systems&rft.au=Wu%2C+Tony+F.&rft.au=Ganesan%2C+Karthik&rft.au=Hu%2C+Yunqing+Alexander&rft.au=Wong%2C+H.-S.+Philip&rft.date=2016-04-01&rft.issn=0278-0070&rft.eissn=1937-4151&rft.volume=35&rft.issue=4&rft.spage=521&rft.epage=534&rft_id=info:doi/10.1109%2FTCAD.2015.2474373&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TCAD_2015_2474373 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0278-0070&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0278-0070&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0278-0070&client=summon |