APA (7th ed.) Citation

Ashiwal, V., Miguel-Escrig, O., Wiesmayr, B., Zoitl, A., & Romero-Perez, J. (2025). Identification and Evaluation of Pitfalls in the Migration From IEC 61131-3 to IEC 61499: A Review. IEEE open journal of the Industrial Electronics Society, 6, 575-590. https://doi.org/10.1109/OJIES.2025.3558685

Chicago Style (17th ed.) Citation

Ashiwal, Virendra, Oscar Miguel-Escrig, Bianca Wiesmayr, Alois Zoitl, and Julio-Ariel Romero-Perez. "Identification and Evaluation of Pitfalls in the Migration From IEC 61131-3 to IEC 61499: A Review." IEEE Open Journal of the Industrial Electronics Society 6 (2025): 575-590. https://doi.org/10.1109/OJIES.2025.3558685.

MLA (9th ed.) Citation

Ashiwal, Virendra, et al. "Identification and Evaluation of Pitfalls in the Migration From IEC 61131-3 to IEC 61499: A Review." IEEE Open Journal of the Industrial Electronics Society, vol. 6, 2025, pp. 575-590, https://doi.org/10.1109/OJIES.2025.3558685.