Wen, L., Li, X., Gao, L., & Zhang, Y. (2018). A New Convolutional Neural Network-Based Data-Driven Fault Diagnosis Method. IEEE transactions on industrial electronics (1982), 65(7), 5990-5998. https://doi.org/10.1109/TIE.2017.2774777
Citace podle Chicago (17th ed.)Wen, Long, Xinyu Li, Liang Gao, a Yuyan Zhang. "A New Convolutional Neural Network-Based Data-Driven Fault Diagnosis Method." IEEE Transactions on Industrial Electronics (1982) 65, no. 7 (2018): 5990-5998. https://doi.org/10.1109/TIE.2017.2774777.
Citace podle MLA (9th ed.)Wen, Long, et al. "A New Convolutional Neural Network-Based Data-Driven Fault Diagnosis Method." IEEE Transactions on Industrial Electronics (1982), vol. 65, no. 7, 2018, pp. 5990-5998, https://doi.org/10.1109/TIE.2017.2774777.
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