Kim, M., Kim, S., & Shin, H. (2020). A Compact Model for ISPP of 3-D Charge-Trap NAND Flash Memories. IEEE transactions on electron devices, 67(8), 3095-3101. https://doi.org/10.1109/TED.2020.3000448
Chicago Style (17th ed.) CitationKim, Minsoo, Sungbak Kim, and Hyungcheol Shin. "A Compact Model for ISPP of 3-D Charge-Trap NAND Flash Memories." IEEE Transactions on Electron Devices 67, no. 8 (2020): 3095-3101. https://doi.org/10.1109/TED.2020.3000448.
MLA (9th ed.) CitationKim, Minsoo, et al. "A Compact Model for ISPP of 3-D Charge-Trap NAND Flash Memories." IEEE Transactions on Electron Devices, vol. 67, no. 8, 2020, pp. 3095-3101, https://doi.org/10.1109/TED.2020.3000448.
Warning: These citations may not always be 100% accurate.