A New Critical Variable Analysis in Processor-Based Systems

Determining the dependability of integrated systems with respect to soft errors is necessary for a growing number of applications. The most critical information must be identified to achieve good efficiency/cost trade-offs when selective hardening is necessary. In processor-based systems, the most c...

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Bibliographic Details
Published in:	IEEE transactions on nuclear science Vol. 57; no. 4; pp. 1992 - 1999
Main Authors:	Bergaoui, Salma, Vanhauwaert, Pierre, Leveugle, Regis
Format:	Journal Article
Language:	English
Published:	New York IEEE 01.08.2010 The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Institute of Electrical and Electronics Engineers
Subjects:	Algorithms Application software Applications programs Circuit faults Costs Counting circuits Critical variables criticality analysis Data analysis dependability Engineering Sciences Faults Hardening Land surface temperature Micro and nanotechnologies Microelectronics microprocessor-based systems Microprocessors Ocean temperature register criticality Registers Sea level Soft errors Tradeoffs microprocessor-chips
ISSN:	0018-9499, 1558-1578
Online Access:	Get full text
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