A New Critical Variable Analysis in Processor-Based Systems
Determining the dependability of integrated systems with respect to soft errors is necessary for a growing number of applications. The most critical information must be identified to achieve good efficiency/cost trade-offs when selective hardening is necessary. In processor-based systems, the most c...
Gespeichert in:
| Veröffentlicht in: | IEEE transactions on nuclear science Jg. 57; H. 4; S. 1992 - 1999 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Journal Article |
| Sprache: | Englisch |
| Veröffentlicht: |
New York
IEEE
01.08.2010
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Institute of Electrical and Electronics Engineers |
| Schlagworte: | |
| ISSN: | 0018-9499, 1558-1578 |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Abstract | Determining the dependability of integrated systems with respect to soft errors is necessary for a growing number of applications. The most critical information must be identified to achieve good efficiency/cost trade-offs when selective hardening is necessary. In processor-based systems, the most critical variables and registers must thus be identified for the target application program. An improved algorithm for critical register identification is described and compared to previous work. Fault injection results in a system based on Leon2 are also reported. They demonstrate the impact of micro-architectural characteristics on evaluating the real criticality of the register file. New refinements are suggested for further work based on data dependency analysis. |
|---|---|
| AbstractList | Determining the dependability of integrated systems with respect to soft errors is necessary for a growing number of applications. The most critical information must be identified to achieve good efficiency/cost trade-offs when selective hardening is necessary. In processor-based systems, the most critical variables and registers must thus be identified for the target application program. An improved algorithm for critical register identification is described and compared to previous work. Fault injection results in a system based on Leon2 are also reported. They demonstrate the impact of micro-architectural characteristics on evaluating the real criticality of the register file. New refinements are suggested for further work based on data dependency analysis. |
| Author | Leveugle, Regis Bergaoui, Salma Vanhauwaert, Pierre |
| Author_xml | – sequence: 1 givenname: Salma surname: Bergaoui fullname: Bergaoui, Salma email: Salma.Bergaoui@imag.fr organization: TIMA Lab., UJF, Grenoble, France – sequence: 2 givenname: Pierre surname: Vanhauwaert fullname: Vanhauwaert, Pierre email: Pierre.Vanhauwaert@imag.fr organization: TIMA Lab., UJF, Grenoble, France – sequence: 3 givenname: Regis surname: Leveugle fullname: Leveugle, Regis email: Regis.Leveugle@imag.fr organization: TIMA Lab., UJF, Grenoble, France |
| BackLink | https://hal.science/hal-00550129$$DView record in HAL |
| BookMark | eNp9kEtLAzEUhYMoWKt7wc2AC3Ex9WaSTDK4qsUXlCr42IZMeosp04kmU6X_3pSqiy5c3QffuZx7Dshu61sk5JjCgFKoLp4nT4MC0lQAZ4LDDulRIVROhVS7pAdAVV7xqtonBzHO08gFiB65HGYT_MpGwXXOmiZ7NcGZusFs2JpmFV3MXJs9Bm8xRh_yKxNxmj2tYoeLeEj2ZqaJePRT--Tl5vp5dJePH27vR8NxbpmQXU4NlaCkrKclSlbXgKKo6pLLopS2oLKsZ5DaabJdTxUHO6sMCAOWMQWCI-uT883dN9Po9-AWJqy0N07fDcd6vQMQAmhRfdLEnm3Y9-A_lhg7vXDRYtOYFv0yalVSwcuCqkSebpFzvwzp66gpKMrLdJQlqtxQNvgYA860dZ3pnG-7YFyTUL2OX6f49Tp-_RN_EsKW8Nf5P5KTjcQh4h8u0m8MKPsGpIiNyg |
| CODEN | IETNAE |
| CitedBy_id | crossref_primary_10_1145_3446214 crossref_primary_10_1016_j_microrel_2022_114841 crossref_primary_10_1109_TNS_2014_2310492 crossref_primary_10_1007_s10836_015_5513_9 crossref_primary_10_1007_s10836_013_5371_2 crossref_primary_10_1145_2839300 |
| Cites_doi | 10.1109/DSN.2005.88 10.1109/DATE.2009.5090877 10.1109/DSN.2008.4630118 10.1109/DSN.2002.1028926 10.1109/DDECS.2006.1649610 10.1109/PRDC.2005.19 10.1109/MICRO.2003.1253181 10.1109/TNS.2004.839110 10.1109/OLT.2003.1214381 10.1109/DSN.2007.15 |
| ContentType | Journal Article |
| Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Aug 2010 Distributed under a Creative Commons Attribution 4.0 International License |
| Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Aug 2010 – notice: Distributed under a Creative Commons Attribution 4.0 International License |
| DBID | 97E RIA RIE AAYXX CITATION 7QF 7QL 7QQ 7SC 7SE 7SP 7SR 7T7 7TA 7TB 7U5 7U9 8BQ 8FD C1K F28 FR3 H8D H94 JG9 JQ2 KR7 L7M L~C L~D M7N P64 1XC |
| DOI | 10.1109/TNS.2010.2043540 |
| DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library (IEL) CrossRef Aluminium Industry Abstracts Bacteriology Abstracts (Microbiology B) Ceramic Abstracts Computer and Information Systems Abstracts Corrosion Abstracts Electronics & Communications Abstracts Engineered Materials Abstracts Industrial and Applied Microbiology Abstracts (Microbiology A) Materials Business File Mechanical & Transportation Engineering Abstracts Solid State and Superconductivity Abstracts Virology and AIDS Abstracts METADEX Technology Research Database Environmental Sciences and Pollution Management ANTE: Abstracts in New Technology & Engineering Engineering Research Database Aerospace Database AIDS and Cancer Research Abstracts Materials Research Database ProQuest Computer Science Collection Civil Engineering Abstracts Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional Algology Mycology and Protozoology Abstracts (Microbiology C) Biotechnology and BioEngineering Abstracts Hyper Article en Ligne (HAL) |
| DatabaseTitle | CrossRef Materials Research Database Technology Research Database Computer and Information Systems Abstracts – Academic Mechanical & Transportation Engineering Abstracts ProQuest Computer Science Collection Computer and Information Systems Abstracts Materials Business File Environmental Sciences and Pollution Management Aerospace Database Engineered Materials Abstracts Bacteriology Abstracts (Microbiology B) Algology Mycology and Protozoology Abstracts (Microbiology C) AIDS and Cancer Research Abstracts Industrial and Applied Microbiology Abstracts (Microbiology A) Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering Civil Engineering Abstracts Aluminium Industry Abstracts Virology and AIDS Abstracts Electronics & Communications Abstracts Ceramic Abstracts METADEX Biotechnology and BioEngineering Abstracts Computer and Information Systems Abstracts Professional Solid State and Superconductivity Abstracts Engineering Research Database Corrosion Abstracts |
| DatabaseTitleList | Materials Research Database Solid State and Superconductivity Abstracts |
| Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://ieeexplore.ieee.org/ sourceTypes: Publisher |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering |
| EISSN | 1558-1578 |
| EndPage | 1999 |
| ExternalDocumentID | oai:HAL:hal-00550129v1 2775215761 10_1109_TNS_2010_2043540 5550301 |
| Genre | orig-research |
| GroupedDBID | .DC .GJ 0R~ 29I 3O- 4.4 53G 5GY 5RE 5VS 6IK 8WZ 97E A6W AAJGR AARMG AASAJ AAWTH ABAZT ABQJQ ABVLG ACGFO ACGFS ACIWK ACNCT ACPRK AENEX AETEA AETIX AFRAH AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD F5P HZ~ H~9 IAAWW IBMZZ ICLAB IDIHD IFIPE IFJZH IPLJI JAVBF LAI M43 MS~ O9- OCL P2P RIA RIE RNS TAE TN5 VH1 VOH AAYXX CITATION 7QF 7QL 7QQ 7SC 7SE 7SP 7SR 7T7 7TA 7TB 7U5 7U9 8BQ 8FD C1K F28 FR3 H8D H94 JG9 JQ2 KR7 L7M L~C L~D M7N P64 RIG 1XC |
| ID | FETCH-LOGICAL-c357t-1a170877bd6e73bb0e529b647267c2176bf0267d435bd840cf9a05a0c338054e3 |
| IEDL.DBID | RIE |
| ISICitedReferencesCount | 16 |
| ISICitedReferencesURI | http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000283074500036&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| ISSN | 0018-9499 |
| IngestDate | Tue Oct 14 20:58:58 EDT 2025 Sat Sep 27 22:54:22 EDT 2025 Mon Jun 30 08:17:20 EDT 2025 Tue Nov 18 21:39:56 EST 2025 Sat Nov 29 05:53:05 EST 2025 Tue Aug 26 16:55:24 EDT 2025 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 4 |
| Keywords | microprocessor-chips |
| Language | English |
| License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html Distributed under a Creative Commons Attribution 4.0 International License: http://creativecommons.org/licenses/by/4.0 |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c357t-1a170877bd6e73bb0e529b647267c2176bf0267d435bd840cf9a05a0c338054e3 |
| Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 ObjectType-Article-2 ObjectType-Feature-1 content type line 23 |
| PQID | 1081460553 |
| PQPubID | 85457 |
| PageCount | 8 |
| ParticipantIDs | proquest_miscellaneous_861546218 ieee_primary_5550301 hal_primary_oai_HAL_hal_00550129v1 proquest_journals_1081460553 crossref_citationtrail_10_1109_TNS_2010_2043540 crossref_primary_10_1109_TNS_2010_2043540 |
| PublicationCentury | 2000 |
| PublicationDate | 2010-08-01 |
| PublicationDateYYYYMMDD | 2010-08-01 |
| PublicationDate_xml | – month: 08 year: 2010 text: 2010-08-01 day: 01 |
| PublicationDecade | 2010 |
| PublicationPlace | New York |
| PublicationPlace_xml | – name: New York |
| PublicationTitle | IEEE transactions on nuclear science |
| PublicationTitleAbbrev | TNS |
| PublicationYear | 2010 |
| Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Institute of Electrical and Electronics Engineers |
| Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) – name: Institute of Electrical and Electronics Engineers |
| References | ref12 guthaus (ref13) 2001 ref15 ref14 ref11 ref1 bergaoui (ref4) 2009 ref7 (ref2) 0 ref9 ref3 ref6 nethercote (ref10) 2003 ref5 benso (ref8) 2000 |
| References_xml | – year: 2001 ident: ref13 article-title: mibench: a free, commercially representative embedded benchmark suite publication-title: IWWC – start-page: 249 year: 2009 ident: ref4 article-title: idsm: an improved control flow checking approach with disjoint signature monitoring publication-title: Proc Conf on Design of Circuits and Integrated Systems (DCIS) – ident: ref6 doi: 10.1109/DSN.2005.88 – ident: ref11 doi: 10.1109/DATE.2009.5090877 – ident: ref12 doi: 10.1109/DSN.2008.4630118 – ident: ref14 doi: 10.1109/DSN.2002.1028926 – ident: ref15 doi: 10.1109/DDECS.2006.1649610 – ident: ref9 doi: 10.1109/PRDC.2005.19 – year: 2003 ident: ref10 article-title: redux: a dynamic dataflow tracer publication-title: 3rd Worshop on Runtime Verification (RV'03) – ident: ref5 doi: 10.1109/MICRO.2003.1253181 – ident: ref3 doi: 10.1109/TNS.2004.839110 – year: 0 ident: ref2 publication-title: GNU Compiler Collection – ident: ref1 doi: 10.1109/OLT.2003.1214381 – ident: ref7 doi: 10.1109/DSN.2007.15 – start-page: 71 year: 2000 ident: ref8 article-title: a <formula formulatype="inline"> <tex notation="tex">${\rm c}/{\rm c}++$</tex></formula> source to source compiler for dependable applications publication-title: Proc IEEE Int Conf on Dependable Systems and Networks (DSN) |
| SSID | ssj0014505 |
| Score | 2.0405877 |
| Snippet | Determining the dependability of integrated systems with respect to soft errors is necessary for a growing number of applications. The most critical... |
| SourceID | hal proquest crossref ieee |
| SourceType | Open Access Repository Aggregation Database Enrichment Source Index Database Publisher |
| StartPage | 1992 |
| SubjectTerms | Algorithms Application software Applications programs Circuit faults Costs Counting circuits Critical variables criticality analysis Data analysis dependability Engineering Sciences Faults Hardening Land surface temperature Micro and nanotechnologies Microelectronics microprocessor-based systems Microprocessors Ocean temperature register criticality Registers Sea level Soft errors Tradeoffs |
| Title | A New Critical Variable Analysis in Processor-Based Systems |
| URI | https://ieeexplore.ieee.org/document/5550301 https://www.proquest.com/docview/1081460553 https://www.proquest.com/docview/861546218 https://hal.science/hal-00550129 |
| Volume | 57 |
| WOSCitedRecordID | wos000283074500036&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVIEE databaseName: IEEE Electronic Library (IEL) customDbUrl: eissn: 1558-1578 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0014505 issn: 0018-9499 databaseCode: RIE dateStart: 19630101 isFulltext: true titleUrlDefault: https://ieeexplore.ieee.org/ providerName: IEEE |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LS8QwEB5UPOjBt1hfBPEiWDfdtI3F0yrKHpZF8IG3kldxQbqyr9_vTJsWQRG8lTYtZSaTfJOZ-QbgPLMiU8KmaN8yDWOndJjFsQsTKzhXtjCiSsZ8Hcjh8PrtLXtcgsu2FsY5VyWfuSu6rGL5dmzmdFTWSRBOCyrWWpZS1rVabcQgTrjvVoAGjDC-CUnyrPM8fKpzuKgOtDrm-LYFLb9TAmTVWeXHclztMQ-b__u7LdjwWJL1auVvw5Ird2D9G8PgLtz0GC5jrGlowF7RNaZiKdaQkbBRyXyxwHgS3uKeZplnMd-Dl4f757t-6PslhEYkchZGKpLE76dt6qTQmrukm2nih0-lQdcj1QX1m7IoBG3RsTNFpniiuEE3FZGbE_uwUo5LdwBM6tgqp1MplIoLNHKVWm0KxH62qyOuAug0IsyNJxOnnhYfeeVU8CxHoeck9NwLPYCL9o3Pmkjjj7FnqJV2GDFg93uDnO4RZxidnS2iAHZJB-0oL_4Ajhsl5t4cp8SCGlEAOBEBsPYxGhJFR1TpxvNpfo3YLk4R8Rz-_uEjWKszByj57xhWZpO5O4FVs5iNppPTajJ-AYQw2OI |
| linkProvider | IEEE |
| linkToHtml | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3dS9xAEB_8KLR9UKuWpvVjKb4Ijbe53SQGn05RTjyPglfxbdmv0IOSK_fh39-ZZBOEloJvIdmEMLOz-5udmd8AnBROFFq4DO07z2LptYkLKX2cOsG5dqUVdTLm4ygfj8-fnorva_Ctq4Xx3tfJZ_6MLutYvpvZFR2V9VKE04KKtTZTKftJU63VxQxkykO_AjRhBPJtUJIXvcn4ocniokrQ-qDjxSa0_pNSIOveKn8tyPUuc7P9uv_bga2AJtmgUf8HWPPVLrx_wTG4BxcDhgsZa1sasEd0jqlcirV0JGxasVAuMJvHl7irORZ4zPfhx8315GoYh44JsRVpvowTneTE8Gdc5nNhDPdpvzDEEJ_lFp2PzJTUccqhEIxD186Wheap5hYdVcRuXnyEjWpW-U_AciOd9ibLhdayRDPXmTO2RPTn-ibhOoJeK0JlA504dbX4pWq3ghcKha5I6CoIPYLT7o3fDZXGf8Z-Ra10w4gDezgYKbpHrGF0evacRLBHOuhGBfFHcNAqUQWDXBAPakIh4FREwLrHaEoUH9GVn60W6hzRncwQ83z-94eP4e1wcj9So9vx3Rd41-QRUCrgAWws5yt_CG_s83K6mB_VE_MP9tjcKQ |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+new+critical+variable+analysis+in+processor-based+systems&rft.jtitle=IEEE+transactions+on+nuclear+science&rft.au=Bergaoui%2C+S.&rft.au=Vanhauwaert%2C+Pierre&rft.au=Leveugle%2C+R%C3%A9gis&rft.date=2010-08-01&rft.pub=Institute+of+Electrical+and+Electronics+Engineers&rft.issn=0018-9499&rft.eissn=1558-1578&rft.volume=57&rft.issue=4%2C+part+1&rft.spage=1992&rft.epage=1999&rft_id=info:doi/10.1109%2FTNS.2010.2043540&rft.externalDBID=HAS_PDF_LINK&rft.externalDocID=oai%3AHAL%3Ahal-00550129v1 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9499&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9499&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9499&client=summon |