Generalized Ellipsometry Measurements of Crystalline Thin Film and Bulk Tin Oxide

Several bulk and thin‐film crystals of SnO2 are grown and examined using generalized ellipsometry techniques. The bulk samples are grown using the chemical vapor transport technique and thin films of SnO2 are grown using the pulsed laser deposition technique. The bulk samples are examined using the...

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Vydané v:	Physica status solidi. A, Applications and materials science Ročník 219; číslo 16
Hlavní autori:	Jellison, Gerald E., Hermann, Raphaël P., Specht, Elliot D., Boatner, Lynn A., Zac Ward, T., Herklotz, Andreas
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	Weinheim Wiley Subscription Services, Inc 01.08.2022
Predmet:	birefringence Bulk sampling Cross polarization Crystal growth Crystal structure Crystallinity Ellipsometry ellipsometry modeling generalized ellipsometry incomplete beta function optical functions Oxide coatings Pulsed laser deposition Pulsed lasers Rutile Sapphire Spectroscopy Surface roughness Thin films Tin Tin dioxide tin oxide Tin oxides
ISSN:	1862-6300, 1862-6319
On-line prístup:	Získať plný text
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