Generalized Ellipsometry Measurements of Crystalline Thin Film and Bulk Tin Oxide

Several bulk and thin‐film crystals of SnO2 are grown and examined using generalized ellipsometry techniques. The bulk samples are grown using the chemical vapor transport technique and thin films of SnO2 are grown using the pulsed laser deposition technique. The bulk samples are examined using the...

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Bibliographic Details
Published in:	Physica status solidi. A, Applications and materials science Vol. 219; no. 16
Main Authors:	Jellison, Gerald E., Hermann, Raphaël P., Specht, Elliot D., Boatner, Lynn A., Zac Ward, T., Herklotz, Andreas
Format:	Journal Article
Language:	English
Published:	Weinheim Wiley Subscription Services, Inc 01.08.2022
Subjects:	birefringence Bulk sampling Cross polarization Crystal growth Crystal structure Crystallinity Ellipsometry ellipsometry modeling generalized ellipsometry incomplete beta function optical functions Oxide coatings Pulsed laser deposition Pulsed lasers Rutile Sapphire Spectroscopy Surface roughness Thin films Tin Tin dioxide tin oxide Tin oxides
ISSN:	1862-6300, 1862-6319
Online Access:	Get full text
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