APA (7th ed.) Citation

Jellison, G. E., Hermann, R. P., Specht, E. D., Boatner, L. A., Zac Ward, T., & Herklotz, A. (2022). Generalized Ellipsometry Measurements of Crystalline Thin Film and Bulk Tin Oxide. Physica status solidi. A, Applications and materials science, 219(16), -n/a. https://doi.org/10.1002/pssa.202100378

Chicago Style (17th ed.) Citation

Jellison, Gerald E., Raphaël P. Hermann, Elliot D. Specht, Lynn A. Boatner, T. Zac Ward, and Andreas Herklotz. "Generalized Ellipsometry Measurements of Crystalline Thin Film and Bulk Tin Oxide." Physica Status Solidi. A, Applications and Materials Science 219, no. 16 (2022): -n/a. https://doi.org/10.1002/pssa.202100378.

MLA (9th ed.) Citation

Jellison, Gerald E., et al. "Generalized Ellipsometry Measurements of Crystalline Thin Film and Bulk Tin Oxide." Physica Status Solidi. A, Applications and Materials Science, vol. 219, no. 16, 2022, pp. -n/a, https://doi.org/10.1002/pssa.202100378.