Jellison, G. E., Hermann, R. P., Specht, E. D., Boatner, L. A., Zac Ward, T., & Herklotz, A. (2022). Generalized Ellipsometry Measurements of Crystalline Thin Film and Bulk Tin Oxide. Physica status solidi. A, Applications and materials science, 219(16), -n/a. https://doi.org/10.1002/pssa.202100378
Citace podle Chicago (17th ed.)Jellison, Gerald E., Raphaël P. Hermann, Elliot D. Specht, Lynn A. Boatner, T. Zac Ward, a Andreas Herklotz. "Generalized Ellipsometry Measurements of Crystalline Thin Film and Bulk Tin Oxide." Physica Status Solidi. A, Applications and Materials Science 219, no. 16 (2022): -n/a. https://doi.org/10.1002/pssa.202100378.
Citace podle MLA (9th ed.)Jellison, Gerald E., et al. "Generalized Ellipsometry Measurements of Crystalline Thin Film and Bulk Tin Oxide." Physica Status Solidi. A, Applications and Materials Science, vol. 219, no. 16, 2022, pp. -n/a, https://doi.org/10.1002/pssa.202100378.