Time-Aware Instrumentation of Embedded Software

Software instrumentation is a key technique in many stages of the development process. It is particularly important for debugging embedded systems. Instrumented programs produce data traces which enable the developer to locate the origins of misbehaviors in the system under test. However, producing...

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Vydané v:IEEE transactions on industrial informatics Ročník 6; číslo 4; s. 652 - 663
Hlavní autori: Fischmeister, Sebastian, Lam, Patrick
Médium: Journal Article
Jazyk:English
Vydavateľské údaje: Piscataway IEEE 01.11.2010
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Abstract Software instrumentation is a key technique in many stages of the development process. It is particularly important for debugging embedded systems. Instrumented programs produce data traces which enable the developer to locate the origins of misbehaviors in the system under test. However, producing data traces incurs runtime overhead in the form of additional computation resources for capturing and copying the data. The instrumentation may therefore interfere with the system's timing and perturb its behavior. In this work, we propose an instrumentation technique for applications with temporal constraints, specifically targeting background/foreground or cyclic executive systems. Our framework permits reasoning about space and time and enables the composition of software instrumentations. In particular, we propose a definition for trace reliability, which enables us to instrument real-time applications which aggressively push their time budgets. Using the framework, we present a method with low perturbation by optimizing the number of insertion points and trace buffer size with respect to code size and time budgets. Finally, we apply the theory to two concrete case studies: we instrument the OpenEC firmware for the keyboard controller of the One Laptop Per Child project, as well as an implementation of a flash file system.
AbstractList Software instrumentation is a key technique in many stages of the development process. It is particularly important for debugging embedded systems. Instrumented programs produce data traces which enable the developer to locate the origins of misbehaviors in the system under test. However, producing data traces incurs runtime overhead in the form of additional computation resources for capturing and copying the data. The instrumentation may therefore interfere with the system's timing and perturb its behavior. In this work, we propose an instrumentation technique for applications with temporal constraints, specifically targeting background/foreground or cyclic executive systems. Our framework permits reasoning about space and time and enables the composition of software instrumentations. In particular, we propose a definition for trace reliability, which enables us to instrument real-time applications which aggressively push their time budgets. Using the framework, we present a method with low perturbation by optimizing the number of insertion points and trace buffer size with respect to code size and time budgets. Finally, we apply the theory to two concrete case studies: we instrument the OpenEC firmware for the keyboard controller of the One Laptop Per Child project, as well as an implementation of a flash file system.
Software instrumentation is a key technique in many stages of the development process. It is particularly important for debugging embedded systems. Instrumented programs produce data traces which enable the developer to locate the origins of misbehaviors in the system under test. However, producing data traces incurs runtime overhead in the form of additional computation resources for capturing and copying the data. The instrumentation may therefore interfere with the system's timing and perturb its behavior.
Author Fischmeister, Sebastian
Lam, Patrick
Author_xml – sequence: 1
  givenname: Sebastian
  surname: Fischmeister
  fullname: Fischmeister, Sebastian
  email: sfischme@uwaterloo.ca
  organization: Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
– sequence: 2
  givenname: Patrick
  surname: Lam
  fullname: Lam, Patrick
  email: p.lam@ece.uwaterloo.ca
  organization: Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
BookMark eNp9kE1LAzEQQIMo2FbvgpcFD3rZdvIxSfdYStVCwYP1vGTTWdiyHzXZIv57U1o89NBTJvDewLwhu267lhh74DDmHLLJerkcC4g_AXoqQV2xAc8UTwEQruOMyFMpQN6yYQhbAGlAZgM2WVcNpbMf6ylZtqH3-4ba3vZV1yZdmSyagjYb2iSfXdkfoDt2U9o60P3pHbGv18V6_p6uPt6W89kqdRJ1n2aoZam0ReGokMoWmhTxoiyUdEJCJhEdR24NqpIECmGmzkwNWpCOZ0bLEXs-7t357ntPoc-bKjiqa9tStw_5VGVKGwM8ki8XSa4NF1KDNhF9OkO33d638Y6cgwSOggNGSh8p57sQPJW5q45Fem-rOqL5oXgei-eH4vmpeBThTNz5qrH-95LyeFQqIvrHETFTCuQfX3SJ4A
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ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Nov 2010
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Nov 2010
DBID 97E
RIA
RIE
AAYXX
CITATION
7SC
7SP
8FD
JQ2
L7M
L~C
L~D
F28
FR3
DOI 10.1109/TII.2010.2068304
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005–Present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Computer and Information Systems Abstracts
Electronics & Communications Abstracts
Technology Research Database
ProQuest Computer Science Collection
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
ANTE: Abstracts in New Technology & Engineering
Engineering Research Database
DatabaseTitle CrossRef
Technology Research Database
Computer and Information Systems Abstracts – Academic
Electronics & Communications Abstracts
ProQuest Computer Science Collection
Computer and Information Systems Abstracts
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts Professional
Engineering Research Database
ANTE: Abstracts in New Technology & Engineering
DatabaseTitleList
Technology Research Database
Technology Research Database
Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1941-0050
EndPage 663
ExternalDocumentID 2724139681
10_1109_TII_2010_2068304
5559440
Genre orig-research
GroupedDBID 0R~
29I
4.4
5GY
5VS
6IK
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFS
ACIWK
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AKJIK
AKQYR
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
HZ~
IFIPE
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RNS
AAYXX
CITATION
7SC
7SP
8FD
JQ2
L7M
L~C
L~D
RIG
F28
FR3
ID FETCH-LOGICAL-c356t-9563f46a52ceb34ab6e4e1bfb43c2309355c151a754fe252278c7875a03c19763
IEDL.DBID RIE
ISICitedReferencesCount 21
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000283984900016&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 1551-3203
IngestDate Sun Sep 28 09:44:41 EDT 2025
Sun Sep 28 02:22:16 EDT 2025
Mon Jun 30 10:17:29 EDT 2025
Tue Nov 18 22:24:00 EST 2025
Sat Nov 29 04:39:38 EST 2025
Tue Aug 26 17:14:28 EDT 2025
IsPeerReviewed false
IsScholarly true
Issue 4
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c356t-9563f46a52ceb34ab6e4e1bfb43c2309355c151a754fe252278c7875a03c19763
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
content type line 23
ObjectType-Article-2
ObjectType-Feature-1
PQID 1030152105
PQPubID 23500
PageCount 12
ParticipantIDs proquest_miscellaneous_849467701
proquest_miscellaneous_1671236067
crossref_primary_10_1109_TII_2010_2068304
proquest_journals_1030152105
ieee_primary_5559440
crossref_citationtrail_10_1109_TII_2010_2068304
PublicationCentury 2000
PublicationDate 2010-Nov.
2010-11-00
20101101
PublicationDateYYYYMMDD 2010-11-01
PublicationDate_xml – month: 11
  year: 2010
  text: 2010-Nov.
PublicationDecade 2010
PublicationPlace Piscataway
PublicationPlace_xml – name: Piscataway
PublicationTitle IEEE transactions on industrial informatics
PublicationTitleAbbrev TII
PublicationYear 2010
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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SSID ssj0037039
Score 2.1049118
Snippet Software instrumentation is a key technique in many stages of the development process. It is particularly important for debugging embedded systems....
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 652
SubjectTerms Computational modeling
Computer programs
Copying
Debugging
Embedded computer systems
Embedded systems
Instrumentation
Monitoring
Origins
Real time systems
Reliability
Runtime
Software
tracing
Title Time-Aware Instrumentation of Embedded Software
URI https://ieeexplore.ieee.org/document/5559440
https://www.proquest.com/docview/1030152105
https://www.proquest.com/docview/1671236067
https://www.proquest.com/docview/849467701
Volume 6
WOSCitedRecordID wos000283984900016&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Electronic Library (IEL)
  customDbUrl:
  eissn: 1941-0050
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0037039
  issn: 1551-3203
  databaseCode: RIE
  dateStart: 20050101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1JS8UwEB704UEP7mLdqOBFMHZJ0qRHkffwXURQwVtJ0hQEbeUt-vedpO1DcAFvgU5omUlm6cx8A3AWUyPRakhSlkYSlghNpNSScGW0tplwoN9-2IS4vZVPT_ndElwsemGstb74zF66pc_ll42Zu19lEUf3lzEM0JeFyNperV7rUjy5ucdG5QmhaUz7lGScRw_jcVvDlcaZpN1Itt4E-Zkq3xSxty6jjf991yasd15keNWKfQuWbL0Na1-wBXcgcs0d5OpDTWw49jCxr12bUR02VTh81RZ1Thneox52RLvwOBo-XN-QbjoCMZRnM4KBDa1YpnhqMCBmSmeW2URXmlGTtrjpBs25EpxVNuWu5dXg7eQKxZOgE0L3YFA3td2H0HBtSp7yyuQx07nSiaAaV6lJaCa1CiDqGVaYDjrcTbB4KXwIEecFsrhwLC46Fgdwvtjx1sJm_EG741i6oOu4GcBRL5Oiu1fTwg1Fcx5HzAM4XTzGG-HSHKq2zRxpMuEgZdAMBxD-QiNZjhZCxMnBzy8_hFVfJuCbDo9ggEKyx7Bi3mfP08mJP3mfsK3TYg
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3dS8MwED9EBfXBb7E6tYIvgnFtk7Tp45ANh3MITvCtJGkKgnaiTv99L1k6BD_At0AvtNwl99Hkfj-Ak4hqgVFDkLLUgrA4U0QIJQiXWimTZhb025FNZMOhuL_Pb-bgbNYLY4xxl8_MuR26s_xyrCf2V1mbY_rLGBboC5Y5y3drNX6X4trNHToqjwlNItocSkZ5e9TvT29xJVEqqCdla4KQY1X55opdfOmt_e_L1mHV55FhZ2r4DZgz9SasfEEX3IK2be8gnQ_5YsK-A4p98o1GdTiuwu6TMuh1yvAWPbEV2oa7Xnd0cUk8PwLRlKdvBEsbWrFU8kRjScykSg0zsaoUozqZIqdrDOgy46wyCbdNrxr3J5dooBjTELoD8_W4NrsQaq50yRNe6TxiKpcqzqjCUaJjmgolA2g3Ciu0Bw-3HBaPhSsiorxAFRdWxYVXcQCnsxnPU-CMP2S3rEpncl6bAbQamxR-Z70WlhbN5hwRD-B49hj3hD3okLUZT1AmzSyoDAbiAMJfZATLMUZkUbz388uPYOlydD0oBv3h1T4su0sDrgWxBfNoMHMAi_r97eH15dCtwk_fs9ar
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Time-Aware+Instrumentation+of+Embedded+Software&rft.jtitle=IEEE+transactions+on+industrial+informatics&rft.au=Fischmeister%2C+Sebastian&rft.au=Lam%2C+Patrick&rft.date=2010-11-01&rft.issn=1551-3203&rft.eissn=1941-0050&rft.volume=6&rft.issue=4&rft.spage=652&rft.epage=663&rft_id=info:doi/10.1109%2FTII.2010.2068304&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TII_2010_2068304
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1551-3203&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1551-3203&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1551-3203&client=summon