Lindfors, M., & Chen, T. (2020). Regularized LTI system identification in the presence of outliers: A variational EM approach. Automatica (Oxford), 121, 109152. https://doi.org/10.1016/j.automatica.2020.109152
Citace podle Chicago (17th ed.)Lindfors, Martin, a Tianshi Chen. "Regularized LTI System Identification in the Presence of Outliers: A Variational EM Approach." Automatica (Oxford) 121 (2020): 109152. https://doi.org/10.1016/j.automatica.2020.109152.
Citace podle MLA (9th ed.)Lindfors, Martin, a Tianshi Chen. "Regularized LTI System Identification in the Presence of Outliers: A Variational EM Approach." Automatica (Oxford), vol. 121, 2020, p. 109152, https://doi.org/10.1016/j.automatica.2020.109152.
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