Lindfors, M., & Chen, T. (2020). Regularized LTI system identification in the presence of outliers: A variational EM approach. Automatica (Oxford), 121, 109152. https://doi.org/10.1016/j.automatica.2020.109152
Chicago Style (17th ed.) CitationLindfors, Martin, and Tianshi Chen. "Regularized LTI System Identification in the Presence of Outliers: A Variational EM Approach." Automatica (Oxford) 121 (2020): 109152. https://doi.org/10.1016/j.automatica.2020.109152.
MLA (9th ed.) CitationLindfors, Martin, and Tianshi Chen. "Regularized LTI System Identification in the Presence of Outliers: A Variational EM Approach." Automatica (Oxford), vol. 121, 2020, p. 109152, https://doi.org/10.1016/j.automatica.2020.109152.
Warning: These citations may not always be 100% accurate.