Finite Element Method Applied to Skin-Effect Problems in Strip Transmission Lines

This paper describes a two-dimensional finite element approach to the quasi-static TEM analysis of shielded or open conducting strips with applications to VLSI parasitic elements and transmission line characteristics of printed circuits. The approach uses a combination of two-dimensional and one-dim...

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Veröffentlicht in:IEEE transactions on microwave theory and techniques Jg. 35; H. 11; S. 1009 - 1013
1. Verfasser: Costache, G.I.
Format: Journal Article
Sprache:Englisch
Veröffentlicht: New York, NY IEEE 01.11.1987
Institute of Electrical and Electronics Engineers
Schlagworte:
Applied sciences
Circuit properties
Distributed parameter circuits
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Finite element methods
Frequency domain analysis
Magnetic analysis
Magnetic domains
Magnetic shielding
Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits
Printed circuits
Strips
Transmission lines
Very large scale integration
Finite element method
Microwave line
Strip line
Magnetic potential
Current distribution
Proximity effect
TEM mode
Skin effect
Resistor
ISSN:0018-9480
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Zusammenfassung:This paper describes a two-dimensional finite element approach to the quasi-static TEM analysis of shielded or open conducting strips with applications to VLSI parasitic elements and transmission line characteristics of printed circuits. The approach uses a combination of two-dimensional and one-dimensional finite elements to solve the field problems in terms of the magnetic vector potential in the frequency domain. The method and the algorithm can be applied to shielded or open conducting strips and takes into account the skin effect and proximity effect between structures. The ac resistance and reactance calculated by rising this approach can be used as input parameters to a circuit analysis program such as SPICE or similar programs.
Bibliographie:ObjectType-Article-2
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ISSN:0018-9480
DOI:10.1109/TMTT.1987.1133799