Unraveling thickness-dependent structural properties of CrSBr nanoflakes using hyperspectral TERS imaging

CrSBr, a layered van der Waals material with intrinsic air stability and layer-dependent magnetic and electronic properties, has emerged as a promising 2D semiconductor. However, nanoscale insight into its thickness-dependent structural and electronic behavior remains limited. In this study, we empl...

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Veröffentlicht in:Optics communications Jg. 595; S. 132349
Hauptverfasser: Danylo, Iryna, Mrđenović, Dušan, Bienz, Siiri, Zenobi, Renato, Sofer, Zdeněk, Kumar, Naresh, Veselý, Martin
Format: Journal Article
Sprache:Englisch
Veröffentlicht: Elsevier B.V 01.12.2025
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ISSN:0030-4018
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Abstract CrSBr, a layered van der Waals material with intrinsic air stability and layer-dependent magnetic and electronic properties, has emerged as a promising 2D semiconductor. However, nanoscale insight into its thickness-dependent structural and electronic behavior remains limited. In this study, we employ hyperspectral tip-enhanced Raman spectroscopy (TERS) imaging to investigate the vibrational and electronic properties of exfoliated CrSBr nanoflakes. Both confocal Raman and TERS measurements reveal a systematic enhancement of the A2g Raman mode relative to the A3g mode in thinner flakes. The I (A2g)/I (A3g) intensity ratio decreases consistently with increasing flake thickness, reflecting underlying changes in the electronic band structure. Hyperspectral TERS mapping confirms this trend at the single-flake level and suggests a resonance Raman enhancement influenced by electron–phonon coupling near the band edge. Our results establish the I (A2g)/I (A3g) ratio as a sensitive spectroscopic marker for thickness-dependent band structure evolution in CrSBr. More broadly, this work highlights hyperspectral TERS as a powerful tool for probing local structure–property relationships in emerging low-dimensional materials. [Display omitted]
AbstractList CrSBr, a layered van der Waals material with intrinsic air stability and layer-dependent magnetic and electronic properties, has emerged as a promising 2D semiconductor. However, nanoscale insight into its thickness-dependent structural and electronic behavior remains limited. In this study, we employ hyperspectral tip-enhanced Raman spectroscopy (TERS) imaging to investigate the vibrational and electronic properties of exfoliated CrSBr nanoflakes. Both confocal Raman and TERS measurements reveal a systematic enhancement of the A2g Raman mode relative to the A3g mode in thinner flakes. The I (A2g)/I (A3g) intensity ratio decreases consistently with increasing flake thickness, reflecting underlying changes in the electronic band structure. Hyperspectral TERS mapping confirms this trend at the single-flake level and suggests a resonance Raman enhancement influenced by electron–phonon coupling near the band edge. Our results establish the I (A2g)/I (A3g) ratio as a sensitive spectroscopic marker for thickness-dependent band structure evolution in CrSBr. More broadly, this work highlights hyperspectral TERS as a powerful tool for probing local structure–property relationships in emerging low-dimensional materials. [Display omitted]
ArticleNumber 132349
Author Mrđenović, Dušan
Kumar, Naresh
Veselý, Martin
Danylo, Iryna
Bienz, Siiri
Sofer, Zdeněk
Zenobi, Renato
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  surname: Mrđenović
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  surname: Bienz
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  givenname: Renato
  surname: Zenobi
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  givenname: Zdeněk
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  surname: Kumar
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  givenname: Martin
  orcidid: 0000-0002-3147-4941
  surname: Veselý
  fullname: Veselý, Martin
  email: veselyr@vscht.cz
  organization: University of Chemistry and Technology Prague, Department of Organic Technology, Technická 5, 166 28, Prague, Czech Republic
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Keywords CrSBr nanoflakes
Energy band structure
Tip-enhanced Raman spectroscopy
Hyperspectral imaging
Two-dimensional semiconductor
Language English
License This is an open access article under the CC BY-NC-ND license.
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Snippet CrSBr, a layered van der Waals material with intrinsic air stability and layer-dependent magnetic and electronic properties, has emerged as a promising 2D...
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SubjectTerms CrSBr nanoflakes
Energy band structure
Hyperspectral imaging
Tip-enhanced Raman spectroscopy
Two-dimensional semiconductor
Title Unraveling thickness-dependent structural properties of CrSBr nanoflakes using hyperspectral TERS imaging
URI https://dx.doi.org/10.1016/j.optcom.2025.132349
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