APA (7th ed.) Citation

Schwarz, T. M., Woods, E., Singh, M. P., Chen, X., Jung, C., Aota, L. S., . . . Gault, B. (2025). In Situ Metallic Coating of Atom Probe Specimen for Enhanced Yield, Performance, and Increased Field-of-View. Microscopy and microanalysis, 30(6), 1109. https://doi.org/10.1093/mam/ozae006

Chicago Style (17th ed.) Citation

Schwarz, Tim M., et al. "In Situ Metallic Coating of Atom Probe Specimen for Enhanced Yield, Performance, and Increased Field-of-View." Microscopy and Microanalysis 30, no. 6 (2025): 1109. https://doi.org/10.1093/mam/ozae006.

MLA (9th ed.) Citation

Schwarz, Tim M., et al. "In Situ Metallic Coating of Atom Probe Specimen for Enhanced Yield, Performance, and Increased Field-of-View." Microscopy and Microanalysis, vol. 30, no. 6, 2025, p. 1109, https://doi.org/10.1093/mam/ozae006.