Nano-scale MOSFET device modelling with quantum mechanical effects
The continuing down-scaling trend of CMOS technology has brought serious deterioration in the accuracy of the SPICE (Simulation Program with Integrated Circuit Emphasis) device models used in the design of chip functions. This is due to in part to hot electron and quantum effects that occur in moder...
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| Published in: | European journal of applied mathematics Vol. 17; no. 4; pp. 465 - 489 |
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| Main Authors: | , , |
| Format: | Journal Article |
| Language: | English |
| Published: |
Cambridge, UK
Cambridge University Press
01.08.2006
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| Subjects: | |
| ISSN: | 0956-7925, 1469-4425 |
| Online Access: | Get full text |
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