A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm

The reliability allowance of circuits tends to decrease with the increase of circuit integration and the application of new technology and materials, and the hardening strategy oriented toward gates is an effective technology for improving the circuit reliability of the current situations. Therefore...

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Veröffentlicht in:	Journal of computer science and technology Jg. 34; H. 5; S. 1136 - 1151
Hauptverfasser:	Xiao, Jie, Shi, Zhan-Hui, Jiang, Jian-Hui, Yang, Xu-Hua, Huang, Yu-Jiao, Hu, Hai-Gen
Format:	Journal Article
Sprache:	Englisch
Veröffentlicht:	New York Springer US 01.09.2019 Springer Nature B.V College of Computer Science and Technology, Zhejiang University of Technology, Hangzhou 310023, China%School of Software Engineering, Tongji University, Shanghai 201804, China
Schlagworte:	Artificial Intelligence Binary codes Circuit reliability Computer Science Convergence Data Structures and Information Theory Gates (circuits) Genetic algorithms Hardening Identification methods Information Systems Applications (incl.Internet) New technology Optimization Parallel operation Regular Paper Software Engineering Theory of Computation locating reliability-critical gate scoring mechanism gate-level circuit reliability directing strategy parallel-structured genetic algorithm
ISSN:	1000-9000, 1860-4749
Online-Zugang:	Volltext
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