Xia, X., Lu, P., Gong, C., Han, B., Yu, J., Yu, J., & Liu, T. (2024). Regularly Truncated M-Estimators for Learning With Noisy Labels. IEEE transactions on pattern analysis and machine intelligence, 46(5), 3522-3536. https://doi.org/10.1109/TPAMI.2023.3347850
Chicago-Zitierstil (17. Ausg.)Xia, Xiaobo, Pengqian Lu, Chen Gong, Bo Han, Jun Yu, Jun Yu, und Tongliang Liu. "Regularly Truncated M-Estimators for Learning With Noisy Labels." IEEE Transactions on Pattern Analysis and Machine Intelligence 46, no. 5 (2024): 3522-3536. https://doi.org/10.1109/TPAMI.2023.3347850.
MLA-Zitierstil (9. Ausg.)Xia, Xiaobo, et al. "Regularly Truncated M-Estimators for Learning With Noisy Labels." IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 46, no. 5, 2024, pp. 3522-3536, https://doi.org/10.1109/TPAMI.2023.3347850.