Finite memory test response compactors for embedded test applications

This paper introduces a new class of finite memory compaction schemes called convolutional compactors (CCs). They provide compaction ratios of test responses in excess of 100/spl times/, even for a very small number of outputs. This is combined with the capability to detect multiple errors, handling...

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Veröffentlicht in:	IEEE transactions on computer-aided design of integrated circuits and systems Jg. 24; H. 4; S. 622 - 634
Hauptverfasser:	Rajski, J., Tyszer, J., Chen Wang, Reddy, S.M.
Format:	Journal Article
Sprache:	Englisch
Veröffentlicht:	New York IEEE 01.04.2005 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Schlagworte:	Associate members Automatic test pattern generation Built-in self-test Carbon capture and storage Circuit testing Compaction Convolutional compactors (CCs) Design for testability design for testability (DFT) embedded test Registers Semiconductor device testing spatial compactors test response compaction time compactors Time factors unknown states
ISSN:	0278-0070, 1937-4151
Online-Zugang:	Volltext
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