Citace podle APA (7th ed.)

Panetta, K., Wan, Q., Agaian, S., Rajeev, S., Kamath, S., Rajendran, R., . . . Yuan, X. (2020). A Comprehensive Database for Benchmarking Imaging Systems. IEEE transactions on pattern analysis and machine intelligence, 42(3), 509-520. https://doi.org/10.1109/TPAMI.2018.2884458

Citace podle Chicago (17th ed.)

Panetta, Karen, et al. "A Comprehensive Database for Benchmarking Imaging Systems." IEEE Transactions on Pattern Analysis and Machine Intelligence 42, no. 3 (2020): 509-520. https://doi.org/10.1109/TPAMI.2018.2884458.

Citace podle MLA (9th ed.)

Panetta, Karen, et al. "A Comprehensive Database for Benchmarking Imaging Systems." IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 42, no. 3, 2020, pp. 509-520, https://doi.org/10.1109/TPAMI.2018.2884458.

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