Panetta, K., Wan, Q., Agaian, S., Rajeev, S., Kamath, S., Rajendran, R., . . . Yuan, X. (2020). A Comprehensive Database for Benchmarking Imaging Systems. IEEE transactions on pattern analysis and machine intelligence, 42(3), 509-520. https://doi.org/10.1109/TPAMI.2018.2884458
Chicago-Zitierstil (17. Ausg.)Panetta, Karen, et al. "A Comprehensive Database for Benchmarking Imaging Systems." IEEE Transactions on Pattern Analysis and Machine Intelligence 42, no. 3 (2020): 509-520. https://doi.org/10.1109/TPAMI.2018.2884458.
MLA-Zitierstil (9. Ausg.)Panetta, Karen, et al. "A Comprehensive Database for Benchmarking Imaging Systems." IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 42, no. 3, 2020, pp. 509-520, https://doi.org/10.1109/TPAMI.2018.2884458.