Benchmarking Single-Image Dehazing and Beyond

We present a comprehensive study and evaluation of existing single-image dehazing algorithms, using a new large-scale benchmark consisting of both synthetic and real-world hazy images, called REalistic Single-Image DEhazing (RESIDE). RESIDE highlights diverse data sources and image contents, and is...

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Vydáno v:	IEEE transactions on image processing Ročník 28; číslo 1; s. 492 - 505
Hlavní autoři:	Li, Boyi, Ren, Wenqi, Fu, Dengpan, Tao, Dacheng, Feng, Dan, Zeng, Wenjun, Wang, Zhangyang
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	United States IEEE 01.01.2019 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Témata:	Algorithms Benchmark testing dataset Dehazing detection evaluations Image enhancement Image fusion Image restoration
ISSN:	1057-7149, 1941-0042, 1941-0042
On-line přístup:	Získat plný text
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Abstract	We present a comprehensive study and evaluation of existing single-image dehazing algorithms, using a new large-scale benchmark consisting of both synthetic and real-world hazy images, called REalistic Single-Image DEhazing (RESIDE). RESIDE highlights diverse data sources and image contents, and is divided into five subsets, each serving different training or evaluation purposes. We further provide a rich variety of criteria for dehazing algorithm evaluation, ranging from full-reference metrics to no-reference metrics and to subjective evaluation, and the novel task-driven evaluation. Experiments on RESIDE shed light on the comparisons and limitations of the state-of-the-art dehazing algorithms, and suggest promising future directions.
AbstractList	We present a comprehensive study and evaluation of existing single-image dehazing algorithms, using a new large-scale benchmark consisting of both synthetic and real-world hazy images, called REalistic Single-Image DEhazing (RESIDE). RESIDE highlights diverse data sources and image contents, and is divided into five subsets, each serving different training or evaluation purposes. We further provide a rich variety of criteria for dehazing algorithm evaluation, ranging from full-reference metrics to no-reference metrics and to subjective evaluation, and the novel task-driven evaluation. Experiments on RESIDE shed light on the comparisons and limitations of the state-of-the-art dehazing algorithms, and suggest promising future directions. In this paper, we present a comprehensive study and evaluation of existing single image dehazing algorithms, using a new large-scale benchmark consisting of both synthetic and real-world hazy images, called REalistic Single Image DEhazing (RESIDE). RESIDE highlights diverse data sources and image contents, and is divided into five subsets, each serving different training or evaluation purposes. We further provide a rich variety of criteria for dehazing algorithm evaluation, ranging from full-reference metrics, to no-reference metrics, to subjective evaluation and the novel task-driven evaluation. Experiments on RESIDE shed light on the comparisons and limitations of stateof- the-art dehazing algorithms, and suggest promising future directions. In this paper, we present a comprehensive study and evaluation of existing single image dehazing algorithms, using a new large-scale benchmark consisting of both synthetic and real-world hazy images, called REalistic Single Image DEhazing (RESIDE). RESIDE highlights diverse data sources and image contents, and is divided into five subsets, each serving different training or evaluation purposes. We further provide a rich variety of criteria for dehazing algorithm evaluation, ranging from full-reference metrics, to no-reference metrics, to subjective evaluation and the novel task-driven evaluation. Experiments on RESIDE shed light on the comparisons and limitations of stateof- the-art dehazing algorithms, and suggest promising future directions.In this paper, we present a comprehensive study and evaluation of existing single image dehazing algorithms, using a new large-scale benchmark consisting of both synthetic and real-world hazy images, called REalistic Single Image DEhazing (RESIDE). RESIDE highlights diverse data sources and image contents, and is divided into five subsets, each serving different training or evaluation purposes. We further provide a rich variety of criteria for dehazing algorithm evaluation, ranging from full-reference metrics, to no-reference metrics, to subjective evaluation and the novel task-driven evaluation. Experiments on RESIDE shed light on the comparisons and limitations of stateof- the-art dehazing algorithms, and suggest promising future directions.
Author	Li, Boyi Fu, Dengpan Tao, Dacheng Zeng, Wenjun Ren, Wenqi Wang, Zhangyang Feng, Dan
Author_xml	– sequence: 1 givenname: Boyi orcidid: 0000-0002-6752-3223 surname: Li fullname: Li, Boyi email: boyilics@gmail.com organization: Computer Science Department, Cornell University, Ithaca, NY, USA – sequence: 2 givenname: Wenqi orcidid: 0000-0001-5481-653X surname: Ren fullname: Ren, Wenqi email: rwq.renwenqi@gmail.com organization: State Key Laboratory of Information Security, Institute of Information Engineering, Chinese Academy of Sciences, Beijing, China – sequence: 3 givenname: Dengpan surname: Fu fullname: Fu, Dengpan email: fdpan@mail.ustc.edu.cn organization: Department of Electronic Engineering and Information Science, University of Science and Technology of China, Hefei, China – sequence: 4 givenname: Dacheng surname: Tao fullname: Tao, Dacheng email: dacheng.tao@sydney.edu.au organization: UBTECH Sydney Artificial Intelligence Centre and the School of Information Technologies, Faculty of Engineering and Information Technologies, The University of Sydney, Darlington, NSW, Australia – sequence: 5 givenname: Dan surname: Feng fullname: Feng, Dan email: dfeng@hust.edu.cn organization: Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, China – sequence: 6 givenname: Wenjun surname: Zeng fullname: Zeng, Wenjun email: wezeng@microsoft.com organization: Microsoft Research, Beijing, China – sequence: 7 givenname: Zhangyang surname: Wang fullname: Wang, Zhangyang email: atlaswang@tamu.edu organization: Department of Computer Science and Engineering, Texas A&M University, College Station, TX, USA
BackLink	https://www.ncbi.nlm.nih.gov/pubmed/30176593$$D View this record in MEDLINE/PubMed
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Cites_doi	10.1109/CVPR.2014.384 10.1016/j.cviu.2017.09.003 10.1145/1360612.1360671 10.1109/CVPR.2015.7299133 10.1109/CVPR.2001.990493 10.1023/A:1016328200723 10.1109/TIP.2015.2446191 10.1109/TIP.2012.2191563 10.1109/TPAMI.2010.168 10.1109/IMSNA.2013.6743260 10.1109/TPAMI.2015.2505283 10.1007/s11220-016-0152-5 10.1109/ICCV.2017.274 10.1109/ICCV.2013.82 10.1016/0951-8320(94)90091-4 10.1109/ICCV.2009.5459251 10.1109/ICCV.2017.511 10.1109/TIP.2006.881959 10.1109/TPAMI.2008.132 10.1109/TIP.2016.2598681 10.1109/ICIP.2017.8296874 10.1109/ICCV.2009.5459382 10.1109/CVPR.2016.185 10.1145/1409060.1409069 10.1109/CVPR.2008.4587643 10.1016/j.cviu.2017.10.014 10.1109/CVPR.2003.1211354 10.1016/j.neucom.2017.04.034 10.1109/CVPR.2008.4587704 10.1016/j.image.2014.06.006 10.1109/TIP.2012.2214050 10.1109/CVPR.2016.188 10.1109/MITS.2012.2189969 10.1109/CVPR.2016.350 10.1109/ICIP.2015.7351475 10.1109/TPAMI.2003.1201821 10.1109/TIP.2018.2820807 10.1093/biomet/39.3-4.324 10.1007/s11263-011-0508-1 10.1109/TIP.2015.2462113 10.1145/2733373.2806219 10.1109/CVPR.2012.6248074 10.1109/CVPRW.2017.150 10.1109/CVPR.2016.518 10.1109/CVPR.2017.106 10.1109/CVPR.2017.690 10.1109/CVPR.2014.383 10.1145/2651362 10.1007/s11263-015-0816-y 10.1109/ICCV.2015.34
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References	ref56 ref12 ref59 ref15 ref58 ref14 li (ref49) 2017; 165 ref52 ref55 ref11 (ref48) 2000 ma (ref57) 2017 ref54 liu (ref67) 2017 ref17 ref16 ref18 shrivastava (ref71) 2016 fattal (ref37) 2014; 34 sakaridis (ref34) 2017 yang (ref53) 2014 ref51 he (ref10) 2009 cheng (ref66) 2017 ref50 treibitz (ref5) 2009 ref46 liu (ref63) 2016 ref45 silberman (ref40) 2012 ref47 ref42 nair (ref29) 2014 ref41 ref44 ref43 ren (ref61) 2015 johnson (ref32) 2016 li (ref72) 2017 mccartney (ref7) 1976 ref9 ref4 ref3 he (ref22) 2011; 33 everingham (ref64) 2007 ref35 ref36 ref75 ref74 ref30 ref33 chen (ref13) 2016 ref2 ren (ref19) 2016 ref39 ref38 (ref1) 0 zhang (ref28) 2017 li (ref73) 2015 kopf (ref6) 2008; 27 ref68 ref24 ref23 ref26 ref69 ref25 ref20 ref65 ref21 ref27 liu (ref70) 2018 li (ref31) 2017 ref60 ref62 narasimhan (ref8) 2000
References_xml	– year: 2017 ident: ref31 publication-title: End-to-end united video dehazing and detection – ident: ref47 doi: 10.1109/CVPR.2014.384 – volume: 165 start-page: 1 year: 2017 ident: ref49 article-title: Haze visibility enhancement: A survey and quantitative benchmarking publication-title: Comput Vis Image Understand doi: 10.1016/j.cviu.2017.09.003 – ident: ref21 doi: 10.1145/1360612.1360671 – ident: ref24 doi: 10.1109/CVPR.2015.7299133 – ident: ref4 doi: 10.1109/CVPR.2001.990493 – ident: ref9 doi: 10.1023/A:1016328200723 – ident: ref14 doi: 10.1109/TIP.2015.2446191 – ident: ref44 doi: 10.1109/TIP.2012.2191563 – year: 2000 ident: ref48 publication-title: Beijing Realtime Weather Photos – volume: 33 start-page: 2341 year: 2011 ident: ref22 article-title: Single image haze removal using dark channel prior publication-title: IEEE Trans Pattern Anal Mach Intell doi: 10.1109/TPAMI.2010.168 – ident: ref30 doi: 10.1109/IMSNA.2013.6743260 – ident: ref38 doi: 10.1109/TPAMI.2015.2505283 – ident: ref59 doi: 10.1007/s11220-016-0152-5 – ident: ref68 doi: 10.1109/ICCV.2017.274 – start-page: 576 year: 2016 ident: ref13 article-title: Robust image and video dehazing with visual artifact suppression via gradient residual minimization publication-title: Proc Eur Conf Comput Vis – ident: ref12 doi: 10.1109/ICCV.2013.82 – ident: ref51 doi: 10.1016/0951-8320(94)90091-4 – start-page: 21 year: 2016 ident: ref63 article-title: SSD: Single shot MultiBox detector publication-title: Proc Eur Conf Comput Vis – year: 2018 ident: ref70 publication-title: Improved techniques for learning to dehaze and beyond A collective study – start-page: 65 year: 2017 ident: ref66 article-title: Robust emotion recognition from low quality and low bit rate video: A deep learning approach publication-title: Proc 7th Conf Affect Comput Intell Interact – ident: ref11 doi: 10.1109/ICCV.2009.5459251 – ident: ref20 doi: 10.1109/ICCV.2017.511 – ident: ref35 doi: 10.1109/TIP.2006.881959 – start-page: 1956 year: 2009 ident: ref10 article-title: Single image haze removal using dark channel prior publication-title: Proc IEEE Conf Comput Vis Pattern Recognit – start-page: 598 year: 2000 ident: ref8 article-title: Chromatic framework for vision in bad weather publication-title: Proc IEEE Comput Soc Conf Comput Vis Pattern Recognit (CVPR) – ident: ref55 doi: 10.1109/TPAMI.2008.132 – ident: ref18 doi: 10.1109/TIP.2016.2598681 – ident: ref46 doi: 10.1109/ICIP.2017.8296874 – start-page: 20 year: 2014 ident: ref29 article-title: An effective surround filter for image dehazing publication-title: Proc Int Conf Interdiscipl Adv Appl Comput – ident: ref25 doi: 10.1109/ICCV.2009.5459382 – ident: ref15 doi: 10.1109/CVPR.2016.185 – start-page: 154 year: 2016 ident: ref19 article-title: Single image dehazing via multi-scale convolutional neural networks publication-title: Proc Eur Conf Comput Vis – volume: 27 start-page: 116-1 year: 2008 ident: ref6 article-title: Deep photo: Model-based photograph enhancement and viewing publication-title: ACM Trans Graph doi: 10.1145/1409060.1409069 – ident: ref2 doi: 10.1109/CVPR.2008.4587643 – ident: ref16 doi: 10.1016/j.cviu.2017.10.014 – start-page: 372 year: 2014 ident: ref53 article-title: Single-image super-resolution: A benchmark publication-title: Proc Eur Conf Comput Vis – start-page: 694 year: 2016 ident: ref32 article-title: Perceptual losses for real-time style transfer and super-resolution publication-title: Proc Eur Conf Comput Vis – ident: ref41 doi: 10.1109/CVPR.2003.1211354 – ident: ref17 doi: 10.1016/j.neucom.2017.04.034 – start-page: 525 year: 2009 ident: ref5 article-title: Polarization: Beneficial for visibility enhancement? publication-title: Proc IEEE Comput Soc Conf Comput Vis Pattern Recognit (CVPR) – ident: ref58 doi: 10.1109/CVPR.2008.4587704 – ident: ref45 doi: 10.1016/j.image.2014.06.006 – ident: ref43 doi: 10.1109/TIP.2012.2214050 – year: 2017 ident: ref67 publication-title: When image denoising meets high-level vision tasks A deep learning approach – ident: ref54 doi: 10.1109/CVPR.2016.188 – ident: ref39 doi: 10.1109/MITS.2012.2189969 – ident: ref42 doi: 10.1109/CVPR.2016.350 – year: 0 ident: ref1 publication-title: How Autonomous Vehicles Will Navigate Bad Weather Remains Foggy – start-page: 491 year: 2017 ident: ref72 article-title: Photo-realistic simulation of road scene for data-driven methods in bad weather publication-title: Proc IEEE Conf Comput Vis and Pattern Recog – start-page: 7016 year: 2017 ident: ref28 article-title: Fast haze removal for nighttime image using maximum reflectance prior publication-title: Proc IEEE CVPR – ident: ref33 doi: 10.1109/ICIP.2015.7351475 – ident: ref3 doi: 10.1109/TPAMI.2003.1201821 – ident: ref69 doi: 10.1109/TIP.2018.2820807 – ident: ref52 doi: 10.1093/biomet/39.3-4.324 – ident: ref26 doi: 10.1007/s11263-011-0508-1 – ident: ref50 doi: 10.1109/TIP.2015.2462113 – year: 2017 ident: ref57 publication-title: Sparse-to-dense Depth prediction from sparse depth samples and a single image – year: 2016 ident: ref71 publication-title: Learning from simulated and unsupervised images through adversarial training – start-page: 91 year: 2015 ident: ref61 article-title: Faster R-CNN: Towards real-time object detection with region proposal networks publication-title: Proc Adv Neural Inf Process Syst – ident: ref74 doi: 10.1145/2733373.2806219 – ident: ref56 doi: 10.1109/CVPR.2012.6248074 – start-page: 79 year: 2015 ident: ref73 article-title: Using user generated online photos to estimate and monitor air pollution in major cities publication-title: Proc ACM 7th Int Conf Internet Multimedia Comput Service – ident: ref36 doi: 10.1109/CVPRW.2017.150 – ident: ref65 doi: 10.1109/CVPR.2016.518 – ident: ref75 doi: 10.1109/CVPR.2017.106 – ident: ref62 doi: 10.1109/CVPR.2017.690 – year: 2017 ident: ref34 publication-title: Semantic foggy scene understanding with synthetic data – year: 1976 ident: ref7 publication-title: Optics of the Atmosphere Scattering by Molecules and Particles – year: 2007 ident: ref64 publication-title: The PASCAL Visual Object Classes Challenge 2007 (VOC2007) Results – ident: ref23 doi: 10.1109/CVPR.2014.383 – volume: 34 start-page: 13-1 year: 2014 ident: ref37 article-title: Dehazing using color-lines publication-title: ACM Trans Graph doi: 10.1145/2651362 – start-page: 746 year: 2012 ident: ref40 article-title: Indoor segmentation and support inference from RGBD images publication-title: Proc Eur Conf Comput Vis – ident: ref60 doi: 10.1007/s11263-015-0816-y – ident: ref27 doi: 10.1109/ICCV.2015.34
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Snippet	We present a comprehensive study and evaluation of existing single-image dehazing algorithms, using a new large-scale benchmark consisting of both synthetic... In this paper, we present a comprehensive study and evaluation of existing single image dehazing algorithms, using a new large-scale benchmark consisting of...
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SubjectTerms	Algorithms Benchmark testing dataset Dehazing detection evaluations Image enhancement Image fusion Image restoration
Title	Benchmarking Single-Image Dehazing and Beyond
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