Ma, Q., Cao, Y., Chen, C., Wan, Y., Fu, G., & Wang, Y. (2018). Intrinsic feature revelation of phase-to-height mapping in phase measuring profilometry. Optics and laser technology, 108, 46-52. https://doi.org/10.1016/j.optlastec.2018.06.049
Citace podle Chicago (17th ed.)Ma, Qiuna, Yiping Cao, Cheng Chen, Yingying Wan, Guangkai Fu, a Yapin Wang. "Intrinsic Feature Revelation of Phase-to-height Mapping in Phase Measuring Profilometry." Optics and Laser Technology 108 (2018): 46-52. https://doi.org/10.1016/j.optlastec.2018.06.049.
Citace podle MLA (9th ed.)Ma, Qiuna, et al. "Intrinsic Feature Revelation of Phase-to-height Mapping in Phase Measuring Profilometry." Optics and Laser Technology, vol. 108, 2018, pp. 46-52, https://doi.org/10.1016/j.optlastec.2018.06.049.
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