Bao, B., Xu, Q., Bao, H., & Chen, M. (2016). Extreme multistability in a memristive circuit. Electronics letters, 52(12), 1008-1010. https://doi.org/10.1049/el.2016.0563
Chicago Style (17th ed.) CitationBao, Bo-Cheng, Quan Xu, Han Bao, and Mo Chen. "Extreme Multistability in a Memristive Circuit." Electronics Letters 52, no. 12 (2016): 1008-1010. https://doi.org/10.1049/el.2016.0563.
MLA (9th ed.) CitationBao, Bo-Cheng, et al. "Extreme Multistability in a Memristive Circuit." Electronics Letters, vol. 52, no. 12, 2016, pp. 1008-1010, https://doi.org/10.1049/el.2016.0563.
Warning: These citations may not always be 100% accurate.