APA (7th ed.) Citation

del Alamo, J., & Joh, J. (2009). GaN HEMT reliability. Microelectronics and reliability, 49(9), 1200-1206. https://doi.org/10.1016/j.microrel.2009.07.003

Chicago Style (17th ed.) Citation

del Alamo, J.A., and J. Joh. "GaN HEMT Reliability." Microelectronics and Reliability 49, no. 9 (2009): 1200-1206. https://doi.org/10.1016/j.microrel.2009.07.003.

MLA (9th ed.) Citation

del Alamo, J.A., and J. Joh. "GaN HEMT Reliability." Microelectronics and Reliability, vol. 49, no. 9, 2009, pp. 1200-1206, https://doi.org/10.1016/j.microrel.2009.07.003.