A Secure JTAG Wrapper for SoC Testing and Debugging

IEEE Std. 1149.1, also known as the Joint Test Access Group (JTAG) standard, provides excellent controllability and observability for ICs and hence is widely used in IC testing, debugging, failure analysis, or even online chip control/monitoring. Unfortunately, it has also become a backdoor for atta...

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Bibliographic Details
Published in:	IEEE access Vol. 10; pp. 37603 - 37612
Main Authors:	Lee, Kuen-Jong, Lu, Zheng-Yao, Yeh, Shih-Chun
Format:	Journal Article
Language:	English
Published:	Piscataway IEEE 2022 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:	Authentication Debugging Encryption Failure analysis Generators Hardware security IEEE test standard security in-field debugging in-field testing Integrated circuits JTAG security memory attack Microprocessors Observability (systems) Physical unclonable function physical unclonable function (PUF) Registers RISC secure JTAG wrapper Testing
ISSN:	2169-3536, 2169-3536
Online Access:	Get full text
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