Kim, J., Lee, Y., & Kim, H. (2018). Detection and clustering of mixed-type defect patterns in wafer bin maps. IISE transactions, 50(2), 99-111. https://doi.org/10.1080/24725854.2017.1386337
Citace podle Chicago (17th ed.)Kim, Jinho, Youngmin Lee, a Heeyoung Kim. "Detection and Clustering of Mixed-type Defect Patterns in Wafer Bin Maps." IISE Transactions 50, no. 2 (2018): 99-111. https://doi.org/10.1080/24725854.2017.1386337.
Citace podle MLA (9th ed.)Kim, Jinho, et al. "Detection and Clustering of Mixed-type Defect Patterns in Wafer Bin Maps." IISE Transactions, vol. 50, no. 2, 2018, pp. 99-111, https://doi.org/10.1080/24725854.2017.1386337.
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