Atomic scale structure of sputtered metal multilayers

A combined theoretical and experimental approach has been used to study nanoscale CoFe/Cu/CoFe multilayer films grown by sputter deposition. Such films have applications in sensors that utilize the giant magnetoresistance effect, for example, read heads in high-density information storage devices. A...

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Veröffentlicht in:	Acta materialia Jg. 49; H. 19; S. 4005 - 4015
Hauptverfasser:	Zhou, X.W., Wadley, H.N.G., Johnson, R.A., Larson, D.J., Tabat, N., Cerezo, A., Petford-Long, A.K., Smith, G.D.W., Clifton, P.H., Martens, R.L., Kelly, T.F.
Format:	Journal Article
Sprache:	Englisch
Veröffentlicht:	Oxford Elsevier Ltd 14.11.2001 Elsevier Science
Schlagworte:	Applied sciences Atom probe Cross-disciplinary physics: materials science; rheology Deposition by sputtering Exact sciences and technology Magnetoresistive effects Materials science Metals. Metallurgy Methods of deposition of films and coatings; film growth and epitaxy Molecular dynamics Multilayers Physics Surfaces & interfaces Magnetoresistive effects Molecular dynamics Multilayers Surfaces & interfaces Atom probe Thin films Interfaces Metals Physical vapor deposition Theoretical study Surfaces Magnetoresistance Sputtering
ISSN:	1359-6454, 1873-2453
Online-Zugang:	Volltext
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