Xia, M., Li, T., Liu, L., Xu, L., & de Silva, C. W. (2017). Intelligent fault diagnosis approach with unsupervised feature learning by stacked denoising autoencoder. IET science, measurement & technology, 11(6), 687-695. https://doi.org/10.1049/iet-smt.2016.0423
Citace podle Chicago (17th ed.)Xia, Min, Teng Li, Lizhi Liu, Lin Xu, a Clarence W. de Silva. "Intelligent Fault Diagnosis Approach with Unsupervised Feature Learning by Stacked Denoising Autoencoder." IET Science, Measurement & Technology 11, no. 6 (2017): 687-695. https://doi.org/10.1049/iet-smt.2016.0423.
Citace podle MLA (9th ed.)Xia, Min, et al. "Intelligent Fault Diagnosis Approach with Unsupervised Feature Learning by Stacked Denoising Autoencoder." IET Science, Measurement & Technology, vol. 11, no. 6, 2017, pp. 687-695, https://doi.org/10.1049/iet-smt.2016.0423.