APA (7th ed.) Citation

Xia, M., Li, T., Liu, L., Xu, L., & de Silva, C. W. (2017). Intelligent fault diagnosis approach with unsupervised feature learning by stacked denoising autoencoder. IET science, measurement & technology, 11(6), 687-695. https://doi.org/10.1049/iet-smt.2016.0423

Chicago Style (17th ed.) Citation

Xia, Min, Teng Li, Lizhi Liu, Lin Xu, and Clarence W. de Silva. "Intelligent Fault Diagnosis Approach with Unsupervised Feature Learning by Stacked Denoising Autoencoder." IET Science, Measurement & Technology 11, no. 6 (2017): 687-695. https://doi.org/10.1049/iet-smt.2016.0423.

MLA (9th ed.) Citation

Xia, Min, et al. "Intelligent Fault Diagnosis Approach with Unsupervised Feature Learning by Stacked Denoising Autoencoder." IET Science, Measurement & Technology, vol. 11, no. 6, 2017, pp. 687-695, https://doi.org/10.1049/iet-smt.2016.0423.