Adding Inverter Fault Detection to Model-Based Predictive Control for Flying-Capacitor Inverters

As inverters are often used in critical applications, reliability is an important issue. In particular, the power electronic switches and gate drivers, the most essential components of the inverter, are vulnerable parts in real live operation. Therefore, this paper focuses on open-switch fault detec...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on industrial electronics (1982) Vol. 62; no. 4; pp. 2054 - 2063
Main Authors: Druant, Joachim, Vyncke, Thomas, De Belie, Frederik, Sergeant, Peter, Melkebeek, Jan
Format: Journal Article
Language:English
Published: New York IEEE 01.04.2015
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:
ISSN:0278-0046, 1557-9948
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Abstract As inverters are often used in critical applications, reliability is an important issue. In particular, the power electronic switches and gate drivers, the most essential components of the inverter, are vulnerable parts in real live operation. Therefore, this paper focuses on open-switch fault detection for multilevel inverters. When a single-switch open-circuit fault occurs in one of the power electronic switches, the algorithm can detect the fault and the switch that is causing it. The detection is worked out for both a linear resistive inductive load and an induction motor. The proposed algorithm is an extension of an already available finite-set model-based predictive control algorithm. Therefore, no extra hardware or measurements are required. This paper also discusses a suggested method for reconfiguration after fault detection. Computer simulation and experimental verifications validate the proposed methods.
AbstractList As inverters are often used in critical applications, reliability is an important issue. In particular, the power electronic switches and gate drivers, the most essential components of the inverter, are vulnerable parts in real live operation. Therefore, this paper focuses on open-switch fault detection for multilevel inverters. When a single-switch open-circuit fault occurs in one of the power electronic switches, the algorithm can detect the fault and the switch that is causing it. The detection is worked out for both a linear resistive inductive load and an induction motor. The proposed algorithm is an extension of an already available finite-set model-based predictive control algorithm. Therefore, no extra hardware or measurements are required. This paper also discusses a suggested method for reconfiguration after fault detection. Computer simulation and experimental verifications validate the proposed methods.
Author De Belie, Frederik
Vyncke, Thomas
Sergeant, Peter
Melkebeek, Jan
Druant, Joachim
Author_xml – sequence: 1
  givenname: Joachim
  surname: Druant
  fullname: Druant, Joachim
  email: Joachim.Druant@ugent.be
  organization: Dept. of Electr. Energy, Syst. & Autom., Ghent Univ., Ghent, Belgium
– sequence: 2
  givenname: Thomas
  surname: Vyncke
  fullname: Vyncke, Thomas
  email: thomas.vyncke@dana.com
  organization: Dept. of Electr. Energy, Syst. & Autom., Ghent Univ., Ghent, Belgium
– sequence: 3
  givenname: Frederik
  surname: De Belie
  fullname: De Belie, Frederik
  organization: Dept. of Electr. Energy, Syst. & Autom., Ghent Univ., Ghent, Belgium
– sequence: 4
  givenname: Peter
  surname: Sergeant
  fullname: Sergeant, Peter
  email: Peter.Sergeant@ugent.be
  organization: Dept. of Electr. Energy, Syst. & Autom., Ghent Univ., Ghent, Belgium
– sequence: 5
  givenname: Jan
  surname: Melkebeek
  fullname: Melkebeek, Jan
  organization: Dept. of Electr. Energy, Syst. & Autom., Ghent Univ., Ghent, Belgium
BookMark eNp9kM1PAjEQxRuDiYDeTbw08bzYbj-2e0QEJcHoAc-1bGfNknWLbSHhv7cE9ODB0yQz7_dm5g1Qr3MdIHRNyYhSUt4t59NRTigf5UxwUdIz1KdCFFlZctVDfZIXKiOEyws0CGFNklJQ0UfvY2ub7gPPux34CB7PzLaN-AEiVLFxHY4OPzsLbXZvAlj86sE2abIDPHFd9K7FtUtUu08u2cRsTNXE1PjxC5fovDZtgKtTHaK32XQ5ecoWL4_zyXiRVYyxmCmgxQq4WNUV44TXtkhFCC4hN8IU0lJpZVGpkuRMWVWtDCdKcMKENYwozobo9ui78e5rCyHqtdv6Lq3UVErGCC-USCp5VFXeheCh1ulcc3g0etO0mhJ9SFOnNPUhTX1KM4HkD7jxzafx-_-QmyPSAMCvXKqSUkXYN0kVgNg
CODEN ITIED6
CitedBy_id crossref_primary_10_1016_j_solener_2017_08_069
crossref_primary_10_1049_iet_pel_2015_1025
crossref_primary_10_1109_TTE_2022_3161988
crossref_primary_10_1109_TIE_2015_2477262
crossref_primary_10_1109_TIE_2016_2519323
crossref_primary_10_1109_TIE_2016_2546223
crossref_primary_10_1016_j_jii_2016_07_001
crossref_primary_10_1109_TIA_2021_3052155
crossref_primary_10_1109_TPEL_2018_2854226
crossref_primary_10_1109_ACCESS_2022_3193790
crossref_primary_10_1049_tje2_70001
crossref_primary_10_1049_iet_pel_2016_0787
crossref_primary_10_1109_TIE_2016_2614267
crossref_primary_10_1109_TIA_2019_2952316
crossref_primary_10_1049_iet_pel_2016_0823
crossref_primary_10_1109_TIE_2016_2613987
crossref_primary_10_1109_TIE_2018_2868024
crossref_primary_10_3390_en14082049
crossref_primary_10_3390_en14113163
crossref_primary_10_1109_TIE_2015_2494535
crossref_primary_10_1109_JESTPE_2021_3101849
crossref_primary_10_1109_TIA_2023_3310491
crossref_primary_10_1049_iet_epa_2017_0631
crossref_primary_10_1109_TIE_2020_3048288
crossref_primary_10_3390_computation7040063
crossref_primary_10_1016_j_prime_2022_100035
crossref_primary_10_1109_JESTPE_2018_2888879
crossref_primary_10_1109_MIE_2015_2478920
crossref_primary_10_1016_j_epsr_2018_11_013
crossref_primary_10_3390_en15217976
crossref_primary_10_1007_s00542_015_2767_1
crossref_primary_10_1049_pel2_12564
crossref_primary_10_1109_TPEL_2016_2541342
crossref_primary_10_3390_sym14081735
crossref_primary_10_1016_j_ijepes_2020_106380
crossref_primary_10_1109_TII_2016_2529589
crossref_primary_10_1080_21681724_2020_1809717
crossref_primary_10_1049_cds2_12033
crossref_primary_10_3390_math10193463
crossref_primary_10_1109_TIE_2016_2606359
crossref_primary_10_1109_TIE_2016_2624722
Cites_doi 10.1109/ECCE.2013.6646832
10.1109/TII.2012.2209665
10.1109/TIE.2008.2007030
10.1109/TPEL.2011.2121920
10.1109/TPEL.2012.2192503
10.1109/TPEL.2007.915788
10.1109/TII.2012.2223707
10.1109/TPEL.2004.830074
10.1109/TIA.2014.2326084
10.1109/TIE.2012.2206352
10.1109/JESTPE.2013.2293518
10.1109/TPEL.2011.2135866
10.1109/TII.2012.2221469
10.1109/TIE.2012.2207655
10.1109/TPEL.2010.2049377
10.1109/63.988678
10.1109/TPEL.2013.2243846
10.1109/SLED-PRECEDE.2013.6684498
10.1109/TIE.2013.2289882
10.1109/ECCE.2012.6342611
10.1109/TPEL.2011.2143430
10.1109/TIE.2010.2041733
10.1109/TIA.2009.2027535
10.1109/TIE.2004.825284
10.1109/TPEL.2013.2266377
10.1109/TIE.2012.2227898
10.1109/TIE.2012.2206344
10.1109/TIE.2008.2008349
10.1049/iet-pel.2011.0040
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2015
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2015
DBID 97E
RIA
RIE
AAYXX
CITATION
7SP
8FD
L7M
DOI 10.1109/TIE.2014.2354591
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005–Present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Electronics & Communications Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList
Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Xplore
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1557-9948
EndPage 2063
ExternalDocumentID 3623501961
10_1109_TIE_2014_2354591
6891180
Genre orig-research
GrantInformation_xml – fundername: Research Foundation—Flanders (FWO)
GroupedDBID -~X
.DC
0R~
29I
4.4
5GY
5VS
6IK
97E
9M8
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
ACKIV
ACNCT
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
HZ~
H~9
IBMZZ
ICLAB
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
MS~
O9-
OCL
P2P
RIA
RIE
RNS
TAE
TN5
TWZ
VH1
VJK
AAYXX
CITATION
7SP
8FD
L7M
RIG
ID FETCH-LOGICAL-c333t-8e17be45bfc3404fd73405546e2a5a76d16d67c890238d8cba40854035da30843
IEDL.DBID RIE
ISICitedReferencesCount 58
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000351406000006&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 0278-0046
IngestDate Mon Jun 30 10:23:53 EDT 2025
Tue Nov 18 22:24:00 EST 2025
Sat Nov 29 04:00:14 EST 2025
Tue Aug 26 16:39:35 EDT 2025
IsDoiOpenAccess false
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Issue 4
Keywords field-programmable gate array (FPGA) implementation
induction machine
model-based predictive control (MBPC)
Fault detection
single-switch fault
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c333t-8e17be45bfc3404fd73405546e2a5a76d16d67c890238d8cba40854035da30843
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
OpenAccessLink https://biblio.ugent.be/publication/5951452/file/8724605.pdf
PQID 1663304785
PQPubID 85464
PageCount 10
ParticipantIDs ieee_primary_6891180
proquest_journals_1663304785
crossref_citationtrail_10_1109_TIE_2014_2354591
crossref_primary_10_1109_TIE_2014_2354591
PublicationCentury 2000
PublicationDate 2015-04-01
PublicationDateYYYYMMDD 2015-04-01
PublicationDate_xml – month: 04
  year: 2015
  text: 2015-04-01
  day: 01
PublicationDecade 2010
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE transactions on industrial electronics (1982)
PublicationTitleAbbrev TIE
PublicationYear 2015
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References ref13
ref12
ref15
ref14
ref31
ref30
ref11
ref10
ref2
ref1
ref16
ref19
ref18
hackl (ref4) 0
lu (ref17) 2009; 45
ref24
ref23
ref26
linder (ref3) 2010
ref25
ref20
ref22
ref21
ref28
ref27
ref29
ref8
ref7
ref9
ref6
ref5
References_xml – ident: ref26
  doi: 10.1109/ECCE.2013.6646832
– ident: ref19
  doi: 10.1109/TII.2012.2209665
– ident: ref9
  doi: 10.1109/TIE.2008.2007030
– ident: ref16
  doi: 10.1109/TPEL.2011.2121920
– ident: ref23
  doi: 10.1109/TPEL.2012.2192503
– ident: ref10
  doi: 10.1109/TPEL.2007.915788
– ident: ref6
  doi: 10.1109/TII.2012.2223707
– ident: ref22
  doi: 10.1109/TPEL.2004.830074
– ident: ref28
  doi: 10.1109/TIA.2014.2326084
– ident: ref11
  doi: 10.1109/TIE.2012.2206352
– ident: ref27
  doi: 10.1109/JESTPE.2013.2293518
– ident: ref29
  doi: 10.1109/TPEL.2011.2135866
– year: 2010
  ident: ref3
  publication-title: Model-based Predictive Control of Electric Drives
– ident: ref5
  doi: 10.1109/TII.2012.2221469
– ident: ref20
  doi: 10.1109/TIE.2012.2207655
– ident: ref18
  doi: 10.1109/TPEL.2010.2049377
– ident: ref14
  doi: 10.1109/63.988678
– start-page: 1
  year: 0
  ident: ref4
  article-title: Is multiple-objective model-predictive control optimal?
  publication-title: Proc IEEE Int Symp SLED/PRECEDE
– ident: ref2
  doi: 10.1109/TPEL.2013.2243846
– ident: ref21
  doi: 10.1109/SLED-PRECEDE.2013.6684498
– ident: ref25
  doi: 10.1109/TIE.2013.2289882
– ident: ref13
  doi: 10.1109/ECCE.2012.6342611
– ident: ref24
  doi: 10.1109/TPEL.2011.2143430
– ident: ref15
  doi: 10.1109/TIE.2010.2041733
– volume: 45
  start-page: 1770
  year: 2009
  ident: ref17
  article-title: A literature review of IGBT fault diagnostic and protection methods for power inverters
  publication-title: IEEE Trans Ind Appl
  doi: 10.1109/TIA.2009.2027535
– ident: ref31
  doi: 10.1109/TIE.2004.825284
– ident: ref30
  doi: 10.1109/TPEL.2013.2266377
– ident: ref12
  doi: 10.1109/TIE.2012.2227898
– ident: ref8
  doi: 10.1109/TIE.2012.2206344
– ident: ref1
  doi: 10.1109/TIE.2008.2008349
– ident: ref7
  doi: 10.1049/iet-pel.2011.0040
SSID ssj0014515
Score 2.40995
Snippet As inverters are often used in critical applications, reliability is an important issue. In particular, the power electronic switches and gate drivers, the...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 2054
SubjectTerms Capacitors
Circuit faults
Computer simulation
Control algorithms
Fault detection
Inverters
Switches
Vectors
Title Adding Inverter Fault Detection to Model-Based Predictive Control for Flying-Capacitor Inverters
URI https://ieeexplore.ieee.org/document/6891180
https://www.proquest.com/docview/1663304785
Volume 62
WOSCitedRecordID wos000351406000006&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Xplore
  customDbUrl:
  eissn: 1557-9948
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0014515
  issn: 0278-0046
  databaseCode: RIE
  dateStart: 19820101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3PS8MwFH7o8KAHf01xOiUHL4LZ2iZp0qNOh4KIB4Xdapu8gTA22Tr_fvPariiK4Kk9JKHkS_Je-r73PYDzLBLCKpNzvx4SLjEcc2Mdco0oYoySfFwlCj_ox0czGiVPa3DZ5MIgYkk-wx69lrF8N7NL-lXWj01CimXrsK61rnK1moiBVFW1gogUY_2lbxWSDJL-8_0tcbhkLxLeX0jCbyaorKny4yAurctw53_ftQvbtRfJrirY92ANp_uw9UVbsA2vV47MEiMhDaJtsmG2nBTsBouSfDVlxYxRIbQJv_aGzLGnOYVs6PBjg4q-zrw_y4YTyoPiA29Trd_882a8xQG8DG-fB3e8LqfArRCi4AZDnaNU-dgKGcix0_5BJDWMMpXp2IWxi7WlwKMwztg8I_UzGQjlMhEYKQ6hNZ1N8QiYUzYOMJBOx7kMrTGOZOqcv1rlQiXOdaC_muHU1lrjVPJikpZ3jiBJPSYpYZLWmHTgounxXuls_NG2TRg07erp70B3BWJab8RFGnqPiiKLRh3_3usENv3YqiLjdKFVzJd4Chv2o3hbzM_KNfYJM8XN2w
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3PS8MwFH7oFNSDv8X5MwcvgnFtk7TpUadDcQ4PE7zVNnkDYWyydf795rVdURTBU3tI2pKX5L30-973AM7SQAijdMbdfIi5RH_AtbHII0QRYhBngzJRuBv1evrlJX5agIs6FwYRC_IZXtJtgeXbsZnRr7JWqGNSLFuEJSVl4JfZWjVmIFVZryAgzVh37JuDkl7c6t_fEotLXgbCRQyx_80JFVVVfmzFhX_pbPzvyzZhvYoj2VVp-C1YwNE2rH1RF9yB1ytLjomRlAYRN1knnQ1zdoN5Qb8asXzMqBTakF87V2bZ04RAG9r-WLsksDMX0bLOkDKheNt5VeOW_6R-3nQXnju3_fYdrwoqcCOEyLlGP8pQqmxghPTkwEbuQjQ1DFKVRqH1QxtGhqBHoa02WUr6Z9ITyqbC01LsQWM0HuE-MKtM6KEnbRRm0jdaWxKqs-5wlQkVW9uE1nyEE1OpjVPRi2FSnDq8OHE2ScgmSWWTJpzXPd5LpY0_2u6QDep21fA34WhuxKRaitPEdzEVYYtaHfze6xRW7vqP3aR733s4hFX3HlVSc46gkU9meAzL5iN_m05Oivn2CRQa0SI
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Adding+Inverter+Fault+Detection+to+Model-Based+Predictive+Control+for+Flying-Capacitor+Inverters&rft.jtitle=IEEE+transactions+on+industrial+electronics+%281982%29&rft.au=Druant%2C+Joachim&rft.au=Vyncke%2C+Thomas&rft.au=De+Belie%2C+Frederik&rft.au=Sergeant%2C+Peter&rft.date=2015-04-01&rft.pub=The+Institute+of+Electrical+and+Electronics+Engineers%2C+Inc.+%28IEEE%29&rft.issn=0278-0046&rft.eissn=1557-9948&rft.volume=62&rft.issue=4&rft.spage=2054&rft_id=info:doi/10.1109%2FTIE.2014.2354591&rft.externalDBID=NO_FULL_TEXT&rft.externalDocID=3623501961
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0278-0046&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0278-0046&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0278-0046&client=summon