Vanclooster, A., De Maeyer, P., Fack, V., & Van de Weghe, N. (2013). CALCULATING LEAST RISK PATHS IN 3D INDOOR SPACE. International archives of the photogrammetry, remote sensing and spatial information sciences., XL-2/W2, 113-120. https://doi.org/10.5194/isprsarchives-XL-2-W2-113-2013
Chicago Style (17th ed.) CitationVanclooster, A., Ph De Maeyer, V. Fack, and N. Van de Weghe. "CALCULATING LEAST RISK PATHS IN 3D INDOOR SPACE." International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences. XL-2/W2 (2013): 113-120. https://doi.org/10.5194/isprsarchives-XL-2-W2-113-2013.
MLA (9th ed.) CitationVanclooster, A., et al. "CALCULATING LEAST RISK PATHS IN 3D INDOOR SPACE." International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences., vol. XL-2/W2, 2013, pp. 113-120, https://doi.org/10.5194/isprsarchives-XL-2-W2-113-2013.