Vanclooster, A., De Maeyer, P., Fack, V., & Van de Weghe, N. (2013). CALCULATING LEAST RISK PATHS IN 3D INDOOR SPACE. International archives of the photogrammetry, remote sensing and spatial information sciences., XL-2/W2, 113-120. https://doi.org/10.5194/isprsarchives-XL-2-W2-113-2013
Chicago-Zitierstil (17. Ausg.)Vanclooster, A., Ph De Maeyer, V. Fack, und N. Van de Weghe. "CALCULATING LEAST RISK PATHS IN 3D INDOOR SPACE." International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences. XL-2/W2 (2013): 113-120. https://doi.org/10.5194/isprsarchives-XL-2-W2-113-2013.
MLA-Zitierstil (9. Ausg.)Vanclooster, A., et al. "CALCULATING LEAST RISK PATHS IN 3D INDOOR SPACE." International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences., vol. XL-2/W2, 2013, pp. 113-120, https://doi.org/10.5194/isprsarchives-XL-2-W2-113-2013.