A surface defect identification method based on improved threshold segmentation algorithm

For enterprises, defect detection is very important because it is related to the quality of products produced by enterprises. With the development of machine vision, accurate analysis of image data benefits defect detection. In an enterprise that produces electronic cigarettes, professional and tech...

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Bibliographic Details

Published in:	Journal of physics. Conference series Vol. 1651; no. 1; pp. 12072 - 12076
Main Authors:	Feng, Xinglong, Gao, Xianwen, Luo, Ling
Format:	Journal Article
Language:	English
Published:	Bristol IOP Publishing 01.11.2020
Subjects:	Algorithms Identification methods Image segmentation Machine vision Physics Surface defects Workpieces
ISSN:	1742-6588, 1742-6596
Online Access:	Get full text
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