APA (7th ed.) Citation

Feng, X., Gao, X., & Luo, L. (2020). A surface defect identification method based on improved threshold segmentation algorithm. Journal of physics. Conference series, 1651(1), 12072-12076. https://doi.org/10.1088/1742-6596/1651/1/012072

Chicago Style (17th ed.) Citation

Feng, Xinglong, Xianwen Gao, and Ling Luo. "A Surface Defect Identification Method Based on Improved Threshold Segmentation Algorithm." Journal of Physics. Conference Series 1651, no. 1 (2020): 12072-12076. https://doi.org/10.1088/1742-6596/1651/1/012072.

MLA (9th ed.) Citation

Feng, Xinglong, et al. "A Surface Defect Identification Method Based on Improved Threshold Segmentation Algorithm." Journal of Physics. Conference Series, vol. 1651, no. 1, 2020, pp. 12072-12076, https://doi.org/10.1088/1742-6596/1651/1/012072.