Feng, X., Gao, X., & Luo, L. (2020). A surface defect identification method based on improved threshold segmentation algorithm. Journal of physics. Conference series, 1651(1), 12072-12076. https://doi.org/10.1088/1742-6596/1651/1/012072
Citace podle Chicago (17th ed.)Feng, Xinglong, Xianwen Gao, a Ling Luo. "A Surface Defect Identification Method Based on Improved Threshold Segmentation Algorithm." Journal of Physics. Conference Series 1651, no. 1 (2020): 12072-12076. https://doi.org/10.1088/1742-6596/1651/1/012072.
Citace podle MLA (9th ed.)Feng, Xinglong, et al. "A Surface Defect Identification Method Based on Improved Threshold Segmentation Algorithm." Journal of Physics. Conference Series, vol. 1651, no. 1, 2020, pp. 12072-12076, https://doi.org/10.1088/1742-6596/1651/1/012072.