Feng, X., Gao, X., & Luo, L. (2020). A surface defect identification method based on improved threshold segmentation algorithm. Journal of physics. Conference series, 1651(1), 12072-12076. https://doi.org/10.1088/1742-6596/1651/1/012072
Chicago-Zitierstil (17. Ausg.)Feng, Xinglong, Xianwen Gao, und Ling Luo. "A Surface Defect Identification Method Based on Improved Threshold Segmentation Algorithm." Journal of Physics. Conference Series 1651, no. 1 (2020): 12072-12076. https://doi.org/10.1088/1742-6596/1651/1/012072.
MLA-Zitierstil (9. Ausg.)Feng, Xinglong, et al. "A Surface Defect Identification Method Based on Improved Threshold Segmentation Algorithm." Journal of Physics. Conference Series, vol. 1651, no. 1, 2020, pp. 12072-12076, https://doi.org/10.1088/1742-6596/1651/1/012072.