Non-piezoelectric effects in piezoresponse force microscopy

Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response induced by the inverse piezoelectric effect through the cantil...

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Vydané v:	Current applied physics Ročník 17; číslo 5; s. 661 - 674
Hlavní autori:	Seol, Daehee, Kim, Bora, Kim, Yunseok
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	Elsevier B.V 01.05.2017 한국물리학회
Predmet:	Electrochemical strain Electromechanical response Electrostatic effect Piezoelectric effect Piezoresponse force microscopy 물리학 Electromechanical response Electrostatic effect Electrochemical strain Piezoresponse force microscopy Piezoelectric effect
ISSN:	1567-1739, 1878-1675
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