Non-piezoelectric effects in piezoresponse force microscopy

Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response induced by the inverse piezoelectric effect through the cantil...

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Bibliographic Details

Published in:	Current applied physics Vol. 17; no. 5; pp. 661 - 674
Main Authors:	Seol, Daehee, Kim, Bora, Kim, Yunseok
Format:	Journal Article
Language:	English
Published:	Elsevier B.V 01.05.2017 한국물리학회
Subjects:	Electrochemical strain Electromechanical response Electrostatic effect Piezoelectric effect Piezoresponse force microscopy 물리학 Electromechanical response Electrostatic effect Electrochemical strain Piezoresponse force microscopy Piezoelectric effect
ISSN:	1567-1739, 1878-1675
Online Access:	Get full text
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