Non-piezoelectric effects in piezoresponse force microscopy

Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response induced by the inverse piezoelectric effect through the cantil...

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Vydané v:Current applied physics Ročník 17; číslo 5; s. 661 - 674
Hlavní autori: Seol, Daehee, Kim, Bora, Kim, Yunseok
Médium: Journal Article
Jazyk:English
Vydavateľské údaje: Elsevier B.V 01.05.2017
한국물리학회
Predmet:
Electrochemical strain
Electromechanical response
Electrostatic effect
Piezoelectric effect
Piezoresponse force microscopy
물리학
Electromechanical response
Electrostatic effect
Electrochemical strain
Piezoresponse force microscopy
Piezoelectric effect
ISSN:1567-1739, 1878-1675
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Popis
Shrnutí:Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response induced by the inverse piezoelectric effect through the cantilever dynamics of an atomic force microscopy. However, several non-piezoelectric effects can induce additional contributions to the EM response, which often lead to a misinterpretation of the measured PFM response. This review aims to summarize the non-piezoelectric origins of the EM response that impair the interpretation of PFM measurements. We primarily discuss two major non-piezoelectric origins, namely, the electrostatic effect and electrochemical strain. Several approaches for differentiating the ferroelectric contribution from the EM response are also discussed. The review suggests a fundamental guideline for the proper utilization of the PFM technique, as well as for achieving a reasonable interpretation of observed PFM responses.
Bibliografia:G704-001115.2017.17.5.017
ISSN:1567-1739
1878-1675
DOI:10.1016/j.cap.2016.12.012