Robust Transmit Beamforming for Parameter Estimation Using Distributed Sensors

In this letter, we study the problem of estimating a complex parameter in a wireless sensor network under individual power constraints and bounded channel uncertainty, where the channel state information is assumed to be imperfect at both the sensors and the fusion center. Transmit beamformers and a...

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Vydáno v:IEEE communications letters Ročník 20; číslo 7; s. 1329 - 1332
Hlavní autoři: Jiang Zhu, Blum, Rick S., Xiaokang Lin, Yuantao Gu
Médium: Journal Article
Jazyk:angličtina
Vydáno: New York IEEE 01.07.2016
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN:1089-7798, 1558-2558
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Abstract In this letter, we study the problem of estimating a complex parameter in a wireless sensor network under individual power constraints and bounded channel uncertainty, where the channel state information is assumed to be imperfect at both the sensors and the fusion center. Transmit beamformers and a linear estimator that minimize the maximum mean square error are found. Although this problem is nonconvex, it can be relaxed to become a semidefinite programming problem by re-parameterization and semidefinite relaxation. Surprisingly, we find that relaxation is tight and a global optimal solution can be found. Finally, numerical simulations are performed to evaluate the performance of the robust estimator.
AbstractList In this letter, we study the problem of estimating a complex parameter in a wireless sensor network under individual power constraints and bounded channel uncertainty, where the channel state information is assumed to be imperfect at both the sensors and the fusion center. Transmit beamformers and a linear estimator that minimize the maximum mean square error are found. Although this problem is nonconvex, it can be relaxed to become a semidefinite programming problem by re-parameterization and semidefinite relaxation. Surprisingly, we find that relaxation is tight and a global optimal solution can be found. Finally, numerical simulations are performed to evaluate the performance of the robust estimator.
Author Jiang Zhu
Blum, Rick S.
Xiaokang Lin
Yuantao Gu
Author_xml – sequence: 1
  surname: Jiang Zhu
  fullname: Jiang Zhu
  email: zhujiang11@mails.tsinghua.edu.cn
  organization: Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
– sequence: 2
  givenname: Rick S.
  surname: Blum
  fullname: Blum, Rick S.
  email: rblum@eecs.lehigh.edu
  organization: Electr. & Comput. Eng. Dept., Lehigh Univ., Bethlehem, PA, USA
– sequence: 3
  surname: Xiaokang Lin
  fullname: Xiaokang Lin
  email: linxk@sz.tsinghua.edu.cn
  organization: Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
– sequence: 4
  surname: Yuantao Gu
  fullname: Yuantao Gu
  email: gyt@tsinghua.edu.cn
  organization: Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
BookMark eNp9kE1PAyEURYnRxM8_oJtJ3LiZCgwwsNRaP5LWGm3XhKFvDKYzKDAL_73UGhcu3HBJOJe8dw7Rbu97QOiU4BEhWF1Ox_PZbEQxESPKBReC7qADwrksaT528x1LVda1kvvoMMY3jLGknBygx2ffDDEVi2D62LlUXIPpWh86178WOYsnE0wHCUIxicl1JjnfF8u4eb5xMQXXDAlWxQv00Yd4jPZas45w8pNHaHk7WYzvy-n87mF8NS1tRWUqRSutUhIINKvGVgYDrZTkTS1azA3hNVMcVsCMZMoIa1vLZdPkZMIqZml1hC62_74H_zFATLpz0cJ6bXrwQ9Qkb8cFYbXM6Pkf9M0Poc_TZQpXijGmSKbklrLBxxig1dal72VTMG6tCdYb0fpbtN6I1j-ic5X-qb6HLCp8_l8625YcAPwWaiZqVsnqC3KdjH8
CODEN ICLEF6
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ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016
DBID 97E
RIA
RIE
AAYXX
CITATION
7SP
8FD
L7M
F28
FR3
DOI 10.1109/LCOMM.2016.2565662
DatabaseName IEEE Xplore (IEEE)
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Electronics & Communications Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
ANTE: Abstracts in New Technology & Engineering
Engineering Research Database
DatabaseTitle CrossRef
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
Engineering Research Database
ANTE: Abstracts in New Technology & Engineering
DatabaseTitleList Engineering Research Database

Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1558-2558
EndPage 1332
ExternalDocumentID 4117546901
10_1109_LCOMM_2016_2565662
7467438
Genre orig-research
GrantInformation_xml – fundername: Zhejiang Provincial Natural Science Foundation of China
  grantid: LY16F010005
  funderid: 10.13039/501100004731
– fundername: Fundamental Research Funds for the Central Universities
  grantid: 2015QNA4045
– fundername: National Natural Science Foundation of China
  grantid: NSFC 61371137; 61571263; 61531166005; 51459003
  funderid: 10.13039/501100001809
– fundername: U.S. Army Research Laboratory
  funderid: 10.13039/100006754
– fundername: U.S. Army Research Office
  grantid: W911NF-14-1-0245; W911NF-14-1-0261
  funderid: 10.13039/100000183
GroupedDBID -~X
0R~
29I
4.4
5GY
5VS
6IK
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACIWK
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ATWAV
AZLTO
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
HZ~
H~9
IES
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RNS
TN5
VH1
AAYXX
CITATION
7SP
8FD
L7M
RIG
F28
FR3
ID FETCH-LOGICAL-c328t-6f8c998e1ebdbc3a0e23985b76f05a157495ede4a849a6ccfc58bbccf46c94c23
IEDL.DBID RIE
ISICitedReferencesCount 10
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000384642500015&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 1089-7798
IngestDate Sat Sep 27 19:45:04 EDT 2025
Sun Jun 29 15:47:50 EDT 2025
Tue Nov 18 21:51:28 EST 2025
Sat Nov 29 06:26:37 EST 2025
Wed Aug 27 02:48:13 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 7
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c328t-6f8c998e1ebdbc3a0e23985b76f05a157495ede4a849a6ccfc58bbccf46c94c23
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
content type line 23
PQID 1803944491
PQPubID 85419
PageCount 4
ParticipantIDs ieee_primary_7467438
proquest_journals_1803944491
crossref_citationtrail_10_1109_LCOMM_2016_2565662
proquest_miscellaneous_1825561478
crossref_primary_10_1109_LCOMM_2016_2565662
PublicationCentury 2000
PublicationDate 2016-07-01
PublicationDateYYYYMMDD 2016-07-01
PublicationDate_xml – month: 07
  year: 2016
  text: 2016-07-01
  day: 01
PublicationDecade 2010
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE communications letters
PublicationTitleAbbrev COML
PublicationYear 2016
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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References_xml – ident: ref3
  doi: 10.1109/TSP.2009.2038961
– ident: ref1
  doi: 10.1515/9781400831050
– ident: ref12
  doi: 10.1017/CBO9780511810817
– ident: ref5
  doi: 10.1109/TSP.2010.2062178
– ident: ref4
  doi: 10.1109/TWC.2010.091510.091836
– ident: ref11
  doi: 10.1137/S003614450444614X
– ident: ref2
  doi: 10.1109/TSP.2004.828931
– ident: ref14
  doi: 10.1109/TSP.2014.2373332
– ident: ref6
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– ident: ref7
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– ident: ref8
  doi: 10.1109/TSP.2009.2021456
SSID ssj0008251
Score 2.2350066
Snippet In this letter, we study the problem of estimating a complex parameter in a wireless sensor network under individual power constraints and bounded channel...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 1329
SubjectTerms Beamforming
Channels
collaborative beamforming
Estimation
Estimators
Mathematical models
Mean square values
Optimization
Optimized production technology
Remote sensors
Robust estimation
Robustness
SDP
SDR
Sensor fusion
Sensors
Uncertainty
Title Robust Transmit Beamforming for Parameter Estimation Using Distributed Sensors
URI https://ieeexplore.ieee.org/document/7467438
https://www.proquest.com/docview/1803944491
https://www.proquest.com/docview/1825561478
Volume 20
WOSCitedRecordID wos000384642500015&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Electronic Library (IEL)
  customDbUrl:
  eissn: 1558-2558
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0008251
  issn: 1089-7798
  databaseCode: RIE
  dateStart: 19970101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LS8QwEB5UPOjBt7i-iOBNq02bNsnRJx50FR_graTpFATdym7X328m7RZFETylkGkbZjqTmWbmG4B9Y9zyOEYBT0sVCJs4O6h0EaRUVFXyJBcNuv617PfV87O-m4LDrhYGEX3yGR7RpT_LLyo7pl9lx741RqymYVpK2dRqdVaXSjCbZHrtPEatJgUyoT6-Pru9uaEsrvQo8v5L9G0T8l1Vfphiv79cLv5vZUuw0PqR7KQR_DJM4WAF5r-gC65C_77Kx6Oa-e3o7aVmp2jeyEd1s8yN7M5QZpZjLLtwit7UMDKfQ8DOCU-XWmFhwR5cpFsNR2vwdHnxeHYVtO0TAhtHqg4c860LppBjXuQ2NiES1l-Sy7QME8MT6WIjLFAYJbRJrS1tovLcjSK1WtgoXoeZQTXADWAuxnHKGsaqLGKRICpTKEeRpLmMjDTYAz7hZ2ZbbHFqcfGa-Rgj1JmXQUYyyFoZ9OCgu-e9Qdb4k3qVuN5RtgzvwfZEbFmrfKOMq5DKfYXmPdjrpp3a0FmIGWA1JhrCXuNCqs3fn7wFc_T-JjN3G2bq4Rh3YNZ-1C-j4a7_9j4B203XUg
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1La9wwEB7yKKQ95NnSbZNUgd4SbyxbsqVjnqRkdxvygNyMLI8h0KzLrje_vxrZaxoSAjnZoLERMx5pxprvG4CfxrjpcYwCnpQqEFa6dVDpIkgIVFVymYuGXX-Qjkbq_l5fLcBBh4VBRF98hn269Wf5RWVn9Kvs0LfGiNUiLEshIt6gtbp1l0CYTTm9djGjVnOITKgPBye_h0Oq40r6kY9gomfbkO-r8mIx9jvM-dr75rYOq20kyY4a02_AAo434dN__IJbMLqu8tm0Zn5Denyo2TGaR4pS3ShzV3ZlqDbLqZadOVdvUIzMVxGwU2LUpWZYWLAbl-tWk-lnuDs_uz25CNoGCoGNI1UHTv3WpVPIMS9yG5sQie1P5mlShtJwmbrsCAsURgltEmtLK1Weu6tIrBY2ir_A0rga41dgLstx7hrGqixiIRGVKZSTkEmeRiY12AM-12dmW3ZxanLxJ_NZRqgzb4OMbJC1NujBfvfM34Zb403pLdJ6J9kqvAfbc7NlrftNM65CAvwKzXuw1w07x6HTEDPGakYyxL7GRaq-vf7mH7BycTscZINfo8vv8JHm0tTpbsNSPZnhDnywT_XDdLLrv8N_NLvamQ
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Robust+Transmit+Beamforming+for+Parameter+Estimation+Using+Distributed+Sensors&rft.jtitle=IEEE+communications+letters&rft.au=Zhu%2C+Jiang&rft.au=Blum%2C+Rick+S&rft.au=Lin%2C+Xiaokang&rft.au=Gu%2C+Yuantao&rft.date=2016-07-01&rft.pub=The+Institute+of+Electrical+and+Electronics+Engineers%2C+Inc.+%28IEEE%29&rft.issn=1089-7798&rft.eissn=1558-2558&rft.volume=20&rft.issue=7&rft.spage=1329&rft_id=info:doi/10.1109%2FLCOMM.2016.2565662&rft.externalDBID=NO_FULL_TEXT&rft.externalDocID=4117546901
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1089-7798&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1089-7798&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1089-7798&client=summon