Xia, M., Shao, H., Williams, D., Lu, S., Shu, L., & de Silva, C. W. (2021). Intelligent fault diagnosis of machinery using digital twin-assisted deep transfer learning. Reliability engineering & system safety, 215, 107938. https://doi.org/10.1016/j.ress.2021.107938
Chicago Style (17th ed.) CitationXia, Min, Haidong Shao, Darren Williams, Siliang Lu, Lei Shu, and Clarence W. de Silva. "Intelligent Fault Diagnosis of Machinery Using Digital Twin-assisted Deep Transfer Learning." Reliability Engineering & System Safety 215 (2021): 107938. https://doi.org/10.1016/j.ress.2021.107938.
MLA (9th ed.) CitationXia, Min, et al. "Intelligent Fault Diagnosis of Machinery Using Digital Twin-assisted Deep Transfer Learning." Reliability Engineering & System Safety, vol. 215, 2021, p. 107938, https://doi.org/10.1016/j.ress.2021.107938.